Electronic Design

  
Reprints     Printer-Friendly    Email this Article    RSS        Font Size     What's This?


[TechView: Digital]
Digital Design Tip: Avoid Clusters Of High-Frequency Outputs

Daniel Harris  |   ED Online ID #13089  |   August 3, 2006


One of the many issues FPGA and ASIC designers must now consider before system integration is simultaneous switching output noise (SSO or SSN). Generated by too many closely spaced outputs switching simultaneously, SSN can cause a system or IC to fail. In the end, since you probably don't have control over several key parameters, you should break large high-speed buses into bytes and spread the bytes out as much as feasible.

Determining if SSN will wreak havoc on your system involves the calculation of several system-and component-level parameters. First, you must determine the total inductance, which can be calculated using the following pc-board system parameters:

  • Board thickness
  • Via diameter
  • Pad to via breakout length
  • Breakout width
  • Other pc-board parasitic inductance
  • Socket inductance.

Next, you will need to know the FPGA-or ASIC-specific parametersfor the connected satellite components, including:

  • Maximum input low voltage threshold
  • Maximum input undershoot
  • Maximum allowed ground bounce
  • Maximum load capacitance per device
  • Number and type of nets with similar load characteristics
  • Number of power and ground pins per area, region, or bank
  • Number and type of drivers used
  • Number of SSOs allowed per power and ground pin pair.

If you're designing with an FPGA, you should be able to gather or request this information and the appropriate calculations. If you're building an ASIC, you may need to research this information and create your own calculations based on simulations. Many of these parameters aren't known at design time, forcing an educated guess and erring on the side of caution.

You can submit your useful digital design and debug tips to dharris@penton.com.


Reprints   Printer-Friendly  Email this Article  RSS    Font Size   What's This?


  • Network-On-Chip Tools Arrive for The Masses
  • Tackling System Design Challenges Through Early Verification
  • ESL Tools Take Center Stage As Designers Move Up
  • Parasitic Extraction Tool Targets Next-Generation Custom ICs
  • Synopsys Jumps Into ESL-Synthesis Pool
  • Verify Control Systems Before Committing To Hardware
  • You're Using How Many FPGAs?
  • Tool Up For The FPGA Blitz
    1) Build A Smart Battery Charger Using A Single-Transistor Circuit
    (180 views today)
    2) Hot Hands For Some Cool Rock: Motion Sensing Meets Audio Engineering
    (174 views today)
    3) GPS-Derived Grandmaster Clock Delivers Ultra-Precise Time And Frequency Sync
    (90 views today)
    4) What's All This Transimpedance Amplifier Stuff, Anyhow? (Part 1)
    (81 views today)
    5) Science Fiction Meets Science Fact In Today's Robot Research
    (75 views today)
    ALL TOP 20



    POST YOUR COMMENTS HERE
    Name:

    Email:
    Your Comments:

    Enter the text from the image below


    Please refresh the page if you have trouble reading this text.

    Search Electronic Design
         
      
     
    Web Seminar
    Sponsored By:
    Title: Read Pacing: A Performance Enhancing Feature of PCI Express Gen 2 Switch Devices
    Speakers: 
    Date: 07/01/08
    Register: 

    Electronic Design Europe Electronic Design China EEPN Power Electronics Auto Electronics Microwaves & RF
    Mobile Dev & Design Schematics Find Power Products Military Electronics EE Events Related Resources