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[EDA Alert]

EDA Alert Update: March 18, 2008



David Maliniak  |   ED Online ID #18501  |   March 18, 2008

Article Rating: Not Rated

ED_EDA Alert Update_: Verify SoCs Faster And More Predictably With SystemVerilog And Constrained-Random Stimuli

EDA Alert e-Newsletter |   March 18, 2008

ESC Silicon Valley: Learn Today, Design Tomorrow
ESC Silicon Valley is where the global design engineering community gathers to learn, collaborate and celebrate innovation. ESC is celebrating 20 years of educating the creators of technology at the San Jose Convention Center from April 14 - 17 with over 350 exhibiting companies and over 200 new courses to this year's conference. Register today! Use Code: UX2-D



design solution

Verify SoCs Faster And More Predictably With SystemVerilog And Constrained-Random Stimuli


By Henry Angulo, Praveen Devulapalli, et al.
Synopsys Inc. and Texas Instruments


Verifying the integration and operation of new IP in a legacy system-on-a-chip (SoC) becomes challenging. This is true particularly when the legacy SoC environment was built using a directed test methodology and validation of new IP requires corner case stimulus to achieve required functional coverage.

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Our editors have been busy! Come read their commentaries and check out exclusive videos from the Mobile World Congress, APEC, and Embedded World exhibitions and see the technology of tomorrow from major players in the electronics industry.



news

An Update On SystemC And TLMs



Having found its niche as a verification vehicle, the SystemC language and ecosystem continues to evolve under the aegis of the Open SystemC Initiative (OSCI), a confederation of organizations with various degrees and styles of interest in the language. I recently had occasion to chat with Mike Meredith of Forte Design Systems, who serves as OSCI’s president, and to catch up on some of the activities in the various OSCI working groups.

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Router Boosts Analog Routing Productivity For Matched Devices



Laying out matching devices in custom analog circuits is an error-prone, time-consuming job that can kill analog design yield. Such devices can comprise up to 40% of the devices in a circuit. Silicon Canvas’ matching device router, Laker-MDR, facilitates the special routing requirements of analog-matching devices and automatically generates electrically equivalent routes free of design-rule errors.

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Engine Tinkering Boosts HSpice’s Horsepower



Improvements to the core engine technology behind Synopsys’s HSpice simulator, combined with multi-threading capabilities, gives the tool new life in terms of performance for complex analog and mixed-signal designs. As a result, circuit designers can now run HSpice post-layout simulations up to three-times faster on single-core processors and up to six-times faster on four-core processors than previous versions.

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Flow Analyzes Process Variability



IMEC has developed a variability-aware modeling (VAM) flow that analyzes process variability of technologies below 45 nm. This flow enables designers to optimize their system design for timing, energy, and yield versus expected application load.

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quick poll

In our March 27 cover story, Technology Editor Daniel Harris will look at the state of robotics technology. Which development will we need to see the most before we get a robot in every home?


  • Less expensive sensors
  • Better development software
  • Smarter artificial intelligence
  • More engineers to design the technology
  • Government support

To take the poll, click here. Remember to scroll down, the poll is at the bottom of the page.

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engineer's resource

Webinar: Improving The Accuracy Of Eye Pattern Measurements
Presented by LeCroy
April 9 at 2 pm ET


While eye patterns are a commonly used for signal-integrity analysis, they provide limited usable information about signal integrity. Without very large numbers of measurement samples, testing against compliance masks can lead to ambiguous results. Furthermore, common measurements of signal parameters such as eye height are of limited value at high signal rates due to the complex statistics of the signal amplitude.

This Web seminar, presented by LeCroy Business Development Manager, Michael Schnecker, will describe the limitations of eye-pattern testing and some of the more important eye-based measurements. A measurement technique using the normalized q-scale method from jitter analysis and expanded to two dimensions will be described and its application to mask testing and signal measurements will be demonstrated.

If you work on high bit-rate serial-data signals above approximately 3 Gb/s or are interested in signal integrity measurement, this free seminar is for you.

Click here to register


Happenings/Conferences

Southern Conference on Programmable Logic (SPL'08)
Bariloche-Patagonia, Argentina
March 26-28




International Workshop on System Level Interconnect Prediction (SLIP'08)
Newcastle, UK
April 5-6




Annual Symposium on VLSI (ISVLSI'08)
Montpellier, France
April 7-9




Improving the Accuracy of Eye Pattern Measurements
Webinar
April 9




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WIRELESS SENSING NETWORKS- A Survey of Design Options
Developing a wireless sensor network can be an awesome challenge or a simple matter of picking the right module, depending on who you ask. Off-the-shelf solutions have certain advantages, but may not be the best overall solution to your problem. Home grown or custom solutions can be designed to overcome specific challenges, so they can be critical for certain projects. Learn more about the technical pros & cons of both options in this live course set for April 30th at 2pm eastern. Register now!




ED bookstore

CMOS Circuit Design, Layout, and Simulation: Second Edition


By R. Jacob Baker
ISBN: 978-0-470-22941-5


So for those who are up-and-coming hotshot designers, as well as the veterans who’ve seen a lot of scaling in their time, there’s a good deal of meat in this 1000+ page reference. Covering both long- and short-channel CMOS technologies in a two-path approach, the book begins with the basics, including an introduction to Spice simulation. After chapters on the makeup of a CMOS device, it moves into operational aspects as well as CMOS fabrication.

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