Agilent Technologies Inc. is collaborating with Stanford University in a research program dedicated to exploring a new class of nano-scale devices using combinations of the scanning probe microscope (SPM) and atomic layer deposition (ALD). Allegedly, the research will enable the rapid prototyping and characterization of nano-scale devices with breakthroughs in sub 10-nm scale. The program focuses on the integration of ALD, a thin-film technique capable of sub-nanometer precision in thickness, with the nanometer lateral resolution SPM in a drive to extend the capability of scanning probe techniques to prototyping and device fabrication. For more details, visit www.stanford.edu and www.agilent.com.
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