[Leapfrog: First Look]
Transistor Recovers From Midlife Crisis With Fundamental Material Changes
Not since Neil Armstrong took his first steps on the moon has the transistor seen such a dramatic change, and that change holds some big promises.
Daniel Harris
ED Online ID #14941
March 1, 2007
Copyright © 2006 Penton Media, Inc., All rights reserved. Printing of this document is for personal use only.
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The semiconductor industry is about to experience a
tectonic shift. Wave goodbye to traditional transistors
based on polysilicon-gate electrodes and silicon-dioxide (SiO2) dielectric insulators, which had been used to make the transistor gate dielectric for more than 40 years
because of its manufacturability and ability to deliver continued transistor performance improvements. Say hello to hafnium-gate dielectric insulators and new non-disclosed metal
materials for the NMOS and PMOS transistors that make up
CMOS semiconductors (Fig. 1).
Intel is leading this change with the first working 45-nm multicore processors using these novel technologies. The company
plans on selling CPUs that use the high-k + metal-gate (HK+MG)
stackup in the second half of this year (Fig. 2). Based on the new
Penryn die, these CPUs have been tested with the Windows
Vista, Mac OS X, and Linux operating systems (Fig. 3).
"Intel has developed a complete high-k plus metal-gate solution, with a high-k gate dielectric and two types of metal gate electrodes optimized for NMOS and PMOS transistors," says Kaizad
Mistry, 45-nm Program Manager, Logic Technology Development
of the Technology and Manufacturing Group for Intel. Not since
1969 has there been such a dramatic change to transistors.
"These materials have been integrated together to form a
reliable and manufacturable 45-nm process technology, which
allowed us to demonstrate the world's first working 45-nm CPUs with high-k plus metal-gate transistors just a couple of [months] ago," adds Mistry. "We believe no other company has achieved this level of success with these new transistors." Intel also indicated it has five early version Penryn-based products up and running, and the company plans to build 15 45-nm processors total.
"The implementation of
high-k and metal gate materials marks the biggest change
in transistor technology since
the introduction of polysilicon-gate MOS transistors in the late 1960s," says Intel co-founder Gordon Moore. Compared to
its 65-nm counterparts, the 45-nm HK+MG stackup offers higher transistor density, faster switching speed, reduced gate and
source-to-drain leakage current, and reduced switching power
(see the table).
Along with its research partners AMD, Sony, and Toshiba,
IBM announced a similar breakthrough, with plans to use an
HK+MG transistor in a server-based IC in 2008. Not to be outdone, Sematech also announced an HK+MG transistor stack.
The bandwagon jumping will continue as other fabs follow with
their own flavors of HK+MG solutions.
Intel believes these other companies will need a year or two
to catch up. In the meantime, creating circuits using 45-nm
process technology is still feasible without the combined use of
the new materials. However, leakage would be too problematic
at 32 nm and below using the older poly plus SiO2 stackup.
Silencing critics who said it couldn't be done while delivering
density increases and reductions in leakage currents, these
new technologies are helping Intel, IBM, and other companies
revive Moore's Law for a few more generations. Intel expects to
be at 32 nm in 2009 and 22 nm in 2011.
WHAT'S ALL THIS HIGH-K STUFF, ANYHOW?
Gate
leakage current, source-to-drain leakage current, and increased
heat dissipation have plagued
the industry as transistors
have scaled down in size. In
2004, Intel found that leakage
power accounted for 25% of
total chip power, and this number continues to increase with
each new process shrinkage.
"As more and more transistors are packed onto a single
piece of silicon, the industry
continues to research current
leakage reduction solutions,"
said Mark Bohr, Intel senior
fellow. "Meanwhile our engineers and designers have
achieved a remarkable
accomplishment that ensures
the leadership of Intel products and innovation. Our implementation of novel high-k and metal gate transistors for our 45-nm process
technology will help Intel deliver even
faster, more energy-efficient multicore
products that build upon our successful
Intel Core 2 and Xeon family of processors and extend Moore's Law well into
the next decade."
Gate leakage occurs when electrons
leak across the very dielectric barrier
intended to keep them in place. Source-to-drain leakage takes place when the
transistor is supposed to be in the "off"
state, yet current still flows from source
to drain as it would in the "on" state.
The term "high-k" implies that the
material maintains a high dielectric constant (with respect to SiO2) that creates a
high field effect between the gate and
the channel. Also, it features great electronic insulation properties. The "k"
refers to the material's ability to hold
electric charge.
When evaluating the performance of
two dielectric materials (hafnium and
SiO2 in this case), the relative physical
thickness required to produce the same
gate capacitance can be compared,
providing an idea of relative "electrical
thickness." This is commonly known as
the equivalent oxide thickness (EOT). An
EOT of 1 nm would result from using a
10-nm thick dielectric featuring a k value of 39. Comparably, the k value of
SiO2 is 3.9.
Metal gates also help increase the gate
field effect. Together, the HK+MG stackup
helps to significantly reduce leakage while
increasing the gate capacitance and drive
current. For its 45-nm technology, Intel
deposits the hafnium-based dielectric
using an approach that deposits one
atomic layer at a time.
Known as Atomic Layer Deposition
(ALD), this process provides exquisite control of the dielectric thickness. Intel claims
the overall cost of its 45-nm process is in
line with previous-generation process-based manufacturing trends.
The "secret sauce" that makes these HK+MG transistors unique is the combination of the hafnium's thickness, the
type of hafnium, and the metals used for
the gate electrodes. The combination
determines the net benefits gained and
dictates the reduction in leakage currents (gate and source to drain), the transistor density increase, and the switching speed increase.
None of the companies have disclosed any part of their respective combinations other than to point out that
hafnium is being used to instantiate the
high-k part of the equation. The only
apparent certainty is Intel's feeling that it
has the best "secret sauce," which will at
least help keep the company one generation ahead of its closest rival and may
even increase that gap.
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