[Technology Report]
IC Packages Feel The Squeeze
Packing more IC functionality into smaller form factors stacks the deck against IC makers and foreshadows difficult interconnect challenges.
Roger Allan
ED Online ID #16982
October 11, 2007
Copyright © 2006 Penton Media, Inc., All rights reserved. Printing of this document is for personal use only.
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How much can one package
take? As consumer electronics
design features scale down to
45-nm and even 32-nm nodes,
IC makers are pushed to the
limits to shoehorn more functionality
into these packages-
and lest we not forget
the even thornier interconnection issues.
The logical approach is packaging in the Z direction,
or 3D IC packaging. In the meantime, IC makers
try to satisfy consumer demands with advanced
methods for tried-and-true wire-bonding technology
while looking ahead at flip-chip and wafer-chip
bonding using through-silicon vias (TSVs).
The quest for denser 3D IC packaging spreads
across a spectrum of companies. Amkor, IBM,
IMEC, Intel, Qimonda AG, Samsung, STATS
ChipPAC, Tessera, Texas Instruments, Tezzaron,
Xanoptix, Ziptronix, and ZyCube are all investigating
3D IC packages. Some are also sampling 3D
ICs using TSV technology.
For instance, Amkor Technology Inc., a provider
of advanced semiconductor assembly and test services,
and IMEC, a nonprofit nanoelectronics and
nanotechnology research center based in Belgium,
entered into a two-year collaboration agreement to
develop cost-effective 3D integration technology. It
will be based on wafer-level processing techniques.
Market research firm Yolé Dévelopment foresees
a number of 2D and 3D technologies that will
coexist, depending on the required packaging density.
The firm also expects TSV technology to dominate
future high-density packaging. According to the company, TSV technology first will be used
for packaging memories, followed by adding
logic and then control devices in the form of
ASICs and system-on-a-chip (SoC) ICs.
Stacking continues to be popular, with advances coming at
the chip, wafer, and package levels. Two of the hottest packaging
trends are the use of package-on-package (PoP) and multichip
package (MCP) methods. Chips with lower yields appear
to favor PoPs, but those with high density and performance levels
favor MCPs. Another percolating area revolves around system-
in-package (SiP) technology, where logic and memory
devices are manufactured in their own respective processes and
then joined together in an SiP package.
Memory technology likely will be the first to fully utilize
TSVs on a production basis. Samsung Electronics Co. Ltd. has
crafted an all-DRAM stacked-memory package using waferscale-
package (WSP) TSVs housed in aluminum pads to avoid
performance slow-downs caused by the redistribution layer.
The wafer-level-processed stacked package comprises four
512-Mbit dual-date-rate (DDR2) DRAM chips for 2 Gbits of
high-density memory. The DRAMs are stacked and interconnected
with TSVs to form a 4-Gbyte dual in-line memory
module (DIMM).
In contrast to wire-bonding techniques, this proprietary technology
forms laser-cut, micron-sized holes vertically through
the silicon and connects the memory circuits directly with copper
filling. A proprietary wafer-thinning technique helps eliminate
warped die in the low-profile package.
Meanwhile, WSP has advanced even further with Tezzaron's
FaStack wafer-stacking technology. It allows for the stacking of
sensor, signal-conditioning, memory, and processor chips on a
thin 3D package (Fig. 1).
Even printed-circuit-board (PCB) technology has gone 3D.
Panasonic Electric Works' microscopic integrated processing
technology (MIPTEC) makes it possible to form 3D PCBs on
an injection-molded substrate using fine-pitch laser patterning.
Panasonic claims MIPTEC enables the development of any
number of devices that require flexibility, miniaturization, and
optical, electrical, and thermal properties.
A common challenge to all 3D packaging is creating the right
interconnect technology. Ziptronix's high-yield direct-bondinterconnect
(DBI) technology can be implemented in a die-towafer
or a wafer-to-wafer format. It supports an interconnect
pitch of less than 10 µm with typical interconnect widths of 2
µm and alignment accuracy of 1 µm.
Sematech, a chip-making consortium, believes the interconnect
challenge is crucial. It has opened up membership in its 3D
interconnect program to suppliers, chip makers, assembly and
packaging companies, and other participants. Launched in
2005, the program has been drafted for the International Technology
Roadmap for Semiconductors (ITRS). TSVs represent
one of the program's focus areas.
Continued on page 2.
Eliminate Wire Bonding?
Many packaging experts
consider TSV to be the next step in interconnect technology. In
fact, TSV may very well displace wire bonding. Wire bonding is
a mature technology easily implemented with existing equipment.
However, it doesn't necessarily provide the shortest path
lengths between IC die.
Also, wire bonding requires dies with bond pads located at
edges. That will ultimately limit the number of connections to
the length of the edges divided by the placement resolution of the
wire-bonding machine, particularly when using surface-mounting
technology (SMT). Wire-bonded stacked chips also need
spacing between them, and the wires themselves take up space.
There's no question that wire bonding is an important technology
tool, but it may face certain limitations in the future.
Wire bonding requires vertical spacing between dies of tens of
micrometers, and horizontal spacing of hundreds of micrometers
are needed for the die-connecting wires. Moreover, it can be
argued that wire bonds introduce potential reliability problems,
though the record on this is far from certain.
Still, leading semiconductor IC companies continue to advance
the widely used technology, which they believe costs less than
TSV technology. Samsung recently used wire bonding to pack 16
NAND die into an MCP module that maxes out at a density of
16 Gbytes. "No one knows how far wire bonding will go," says
Dongho Lee, principal engineer for the Interconnect Product and
Technology Group at the Samsung Memory Division.
To solve the limitations of wire-bonding bumps, Tessera
came up with a micro-contact chip-scale package (CSP) for reduced package pitch in high-density area-array CSP products.
The package uses nickel/gold-plated copper bumps that
allow for SMT assembling of the CSP to a board. The microcontact
bump pad can be reduced to a diameter of only 200
µm, compared with 300 µm for a 0.5-mm pitch ball-grid array
(BGA) package (Fig. 2).
Akita Elpida Memory Inc. says it has developed the world's
densest MCP module, with 20 stacked die in a package 1.4
mm thick. To achieve such thinness, the company ground
down individual dies to 30 nm thick and developed handling
equipment for such thin die. Akita then used 40-µm low-loop
wire bonding and devised a method to inject resin without disturbing
the mechanical assembly.
More and more, flip-chip technology is being used instead of
wire bonds. Flip-chip technology connects a die face down to a
PCB or a substrate using BGA technology or other conductive
bumps. This not only eliminates wire bonds, it also increases
signal speeds and reduces overall size constraints.
Freescale Semiconductor took flip-chip technology one step
further with its redistributed chip packaging (RCP) approach
(Fig. 3). A form of PoP, it delivers a large degree of flexibility
thanks to a standardized I/O pin layout. The top chip in an
RCP approach can be any ASIC, such as memory, an applications
processor, a Bluetooth module, or a camera module.
According to Freescale, RCP offers the best combination of
desirable packaging attributes compared to SiP and conventional
PoP methods. The company uses RCP technology in its
mobile extreme convergence (MXC) platform, which features
a single-core modem, a shared-memory subsystem, an RF
power amplifier, and power-management functions. As a
result, one can opt to put an entire GSM (Groupe Spécial
Mobile) EDGE (Enhanced Data rates for GSM Evolution) or
3G radio into a package the size of a U.S. quarter coin.
Tessera's MicroPILR PoP technology could serve a broad
array of chip and board applications for mobile consumer
devices. It can enable package-to-package connections down
to 100 µm and package-to-board links down to 0.3 mm (Fig.
4). Columns stand less than 180 µm high and can be tapered
from diameters ranging from 40 to 375 µm. In comparison,
solder-ball diameters range from 350 to 500 µm.
Samsung Electronics seeks to develop "true" 3D circuitry
through its Fusion program. Described at last December's
IEEE International Electron Devices Meeting
(IEDM), the program's first device is an ultra-dense
NAND flash memory that stacks 32-bit cells in two
interconnected layers.
Initial cells are built on a bulk silicon wafer. Then,
others are built into a thin SOI-like (silicon-on-insulator)
single-crystal silicon layer grown on top of the
back-end-of-the-line dielectric with a common source
line through the two layers. The common source line
solves a potential problem with a floating thin-body
SOI structure that allows only one cell at a time to be
erased. Samsung believes this SOI approach might be
useful for logic circuits, too.
Also this year, STATS ChipPAC announced a stacked flipchip
package for mobile telephone platforms. This 3D package
combines baseband, memory, and analog functions in a single
package-in-a-package (PiP) case.
Continued on page 3
Tsv Times Two
There are two main contending methods
of implementing TSVs: conventional dry etching and laser
drilling. It's also not clear whether or not it's more cost-effective
to generate the TSVs at an IC wafer-fabrication facility or the
IC packaging facility. Companies are now examining the suitability
of laser systems for drilling a wide variety of substrates,
such as ceramics, metal and rare-earth oxides, and polymeric
materials of layered composition.
Generally, laser drilling of TSVs is viewed as more costly than
conventional dry etching. Yet Jeffrey Albelo, director of the laser
singulation group at Electro Scientific Industries, believes laserdrilling
costs are lower than those incurred by dry reactive ion
etching (DRIE) methods on a normalized cost per 1000 vias. He
bases his findings on raw via-drill-rate data.
More companies now see TSVs as the solution to the looming
IC interconnect crisis, which, according to the ITRS, could
emerge within a couple of years. A semiconductor industry
group already has put forth the first draft of a roadmap for
TSV technology and hopes to publish it by the end of this year.
IBM announced it will begin sampling the first commercial
devices that make use of TSV connections. By next year, the
company also will have production quantities of a power
amplifier that features up to 100 direct metal links to a power
ground plane.
New Materials
IC chip makers have long known that
scaling IC geometries downward can crunch the tiny aluminum
and copper interconnect wires in IC designs, causing timing
delays and other problems. The expected shift to copper interconnects
in logic and DRAM circuits will increase unwanted
resistivity levels.
Gold is expected to be used more widely for high-density 3D
packaging. Kulicke & Soffa Industries recently developed Formax,
a new gold wire for stacked and multi-tier applications,
that offers consistent loop profiles, linearity, and stability. It's
also capable of loop heights of less than 3 to 16 mils with wire
spans up to 320 mils in diameter.
Carbon nanotubes (CNTs) may have a future as a material
for 3D interconnects. CNTs potentially can carry more
current per given area, with current density levels reaching
1 x 107 A/cm2. Fujitsu is developing CNTs for 32-nm designs and demonstrated CNT bundles
in 32-nm via holes across 300-mm
wafers at approximately 450°C, with
resistance values as low as those for
tungsten (Fig. 5). The company's
researchers are trying to get as close as
possible to matching the resistance of
CMOS-compatible growth temperatures
of 400°C.
Future Routes
How and when
3D packaging developments will evolve
depends on a number of factors: How
quickly will semiconductor IC manufacturers
adopt novel packaging approaches? What cooling methods are
needed to dissipate increasing heat levels?
What are the compatible processing
equipment and tools, and do they
have the necessary alignment and accuracy
levels?
Most IC experts believe that this may
occur over several phases. In all likelihood,
flash-memory wafer stacks with
TSVs and conductive pastes will evolve.
This will be followed by surface-to-surface
bonding of ICs with surface bump
pitches as small as 5 µm being used.
Eventually, a system-on-silicon methodology
will evolve in which memory,
graphics, and other ICs are bonded face
down to the microprocessor chip.
MEMS IC toolmakers are already
developing tools suitable for the coming
3D era. Presently used for etching
sidewalls and trenches with much larger
line widths of hundreds of micrometers,
these tools could be adapted for
use with finer-line geometries of tens of
micrometers typical for 45-nm and 32-nm processing systems.
A number of equipment providers,
materials companies, and researchers
have joined to create an international
organization to address the technical and
cost issues involved in creating TSV 3D
chip interconnects. The Semiconductor
3D Equipment and Materials Consortium
(EMC-3D) will develop processes for creating
microvias between 5 and 30 µm on
thinned 50- to 300-mm wafers, using
both via-first and via-last techniques.
Equipment companies initiating the
consortium include Alcatel, EV Group,
Semitool, and XSiL. Among the materials
companies are Rohm and Haas, Honeywell,
Enthone, and AZ. Wafer service
support comes from Isonics. Research
partners include Fraunhofer IZM, SAIT
(Samsung Advanced Institute of Technology),
KAIST (Korea Advanced Institute
of Science and Technology), and Texas
A&M University.
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