[Engineering Essentials]
Peer Through The High-Performance Kaleidoscope
Every twist of the wrist reveals a new vista in analog design.
Don Tuite
ED Online ID #19686
September 25, 2008
Copyright © 2006 Penton Media, Inc., All rights reserved. Printing of this document is for personal use only.
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Surveying the “high-performance” analog landscape is a
lot like looking through a kaleidoscope. With each turn,
you’ll see performance characteristics: precision, bandwidth,
conversion rates, noise, power consumption, physical size,
dynamic range, price, etc. Depending on the application, you
may be happy to sacrifice some to optimize others.
Turn the kaleidoscope a little, and you’ll see basic topologies
or input/output configurations. Turn again. Analog-todigital
converter (ADC) “performance” characteristics overlap
depending on whether they’re pipelines, successive approximation
registers (SARs), folded-interpolated, or delta-sigmas.
Lately, thanks to National Semiconductor, it also depends on
whether the delta-sigmas have the old-fashioned discrete-time
inputs or whether they’re continuous-time delta-sigmas.
Yet some of this view also depends on characteristics such as
reference voltage and clock stability, what kinds of clever tricks
designers use to split the input signal between multiple data
converters, the voltage range of the input signal, and whether it’s
double-ended or ground-referenced. What it boils down to is
that one engineer’s high-performance needs differ from those of
another engineer at a company down the road.
Then let’s have some folks in marketing shake the kaleidoscope.
Some will tell you that they’re getting beat up by customers
who simply can’t duplicate the chip company’s datasheet guaranteed performance specs on
their production boards. Another
group thinks its applications engineers
should create bulletproof
reference designs for its front-end
amps and data converters.
Others think it’s best to customize
the silicon totally so that analog
comes in one end and data comes
out the other, while still others take
a modular route, with multiple die
in a single package. Indeed, it’s not
unheard of to find combinations of these
approaches in a single company, depending
on the sales volumes of the potential enduses
of the products.
THE FINAL TWIST OF THE WRIST
With another turn of the kaleidoscope, one
can look at analog performance in terms
of the absolute physical limits of thermal
noise or clock jitter. Is there some kind of
absolute Heisenberg limit you can’t beat?
This is where the question of high performance
gets really interesting.
I talked to a number of people in preparing
this article, and I confess the most
stimulating conversations occurred in the
lab at Linear Technology, where I got to
pull the legendary Jim Williams away from
his test bench and engage him on the topic
of high performance.
When the discussion turned to fundamental
physical limitations, Williams surprised
me by insisting that no one—not
Boltzmann, not Shannon, but no one—had
the power to say “Thus far, and no further.”
He thought it wasn’t so much a matter of
cheating. Rather, it involved renogotiating
the physical issues that we engineers have
to face and overcome.
He presented me with a number of
examples, most of which I should have seen
coming. The chopper-stabilized amplifier
and the sigma-delta modulator, he pointed
out, were two examples from long, long
ago that overcame “fundamental physical
limitations” by redefining the problems.
More recently, Williams said, Intel had
at least temporarily put the gate leakage
problem aside and gained several more
generations for Moore’s law by resurrecting
the multicore processor approach
attempted by Sun with SPARC in 1992. It
didn’t work for Scott McNealy, but had for
Paul Otellini.
Curiously, since we were talking about
parallel processing, Williams’ real hero on
the digital side is Gene Amdahl, which
surprised me. Williams started talking
about oscilloscope probes, which seemed
to be a change in topic. But at least I was
on firm ground since I’d spent several years
working at Tektronix and figured I knew a
465 from a 7912. He then described how
an oscilloscope probe and vertical amplifier
“broke the rules” about transmission lines.
Essentially, the probe doesn’t cause a significant
perturbation on the point in the
circuit it’s measuring. Also, the probe reactance
is adjusted to “compensate” for transmission-
line effects. Therefore, what the
vertical amplifier presents to the scope display
circuitry is an accurate representation
of what’s going on down at the probe tip.
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Anyone who used a scope probe in Beaverton
in the 1970s was sure to get a lesson
in how to find the square-wave reference
signal on the scope and in how to tweak
that compensation screw on the probe. So,
I understood Williams’ point about “breaking”
the rules.
What I didn’t know was that Amdahl
had understood that concept to the point
where he used it on the backplanes of his
minicomputers—a “renegotiation” of the
laws of physics that saved Amdahl all sorts
of interconnect headaches. IBM did something
similar with disc drives.
DATA CONVERTERS AND AMPS
National Semiconductor got considerable
attention early in 2008 for bringing
to market the first continuous-time deltasigma
ADC, the 12-bit, 50-Msample/s
ADC12EU050 (Fig. 1). Unlike a discretetime
delta-sigma, a continuous-time converter
moves the sampling operation from
the input to the ADC to just after the forward
loop filter in the modulator. But what’s
so good about moving the sampling
operation downstream?
In a discrete-time delta-sigma
ADC, there is, as in most ADCs, a
switched-capacitor filter. Designing
one requires the creation of fast
settling circuits and an input buffer
to eliminate sample glitches. Also,
switched-capacitor input filters
set their poles and zeroes through
capacitor ratios relative to the sampling
clock frequency. Because
capacitor thermal noise is inversely proportional
to capacitance, the capacitors
must be relatively large to obtain the best
signal-to-noise ratio (SNR).
In addition, to acquire an accurate representation
of the input signal on a hold
capacitor, the input stages must settle to a
finite level dictated by the accuracy limits
of the system. During acquisition, settling
time depends on the exponential time constant
and slew rate of the system.
What’s good about discrete-time ADCs
is that their input filter characteristics scale
with clock frequency. Filter performance,
therefore, always matches the sample clock
rate. On the other hand, the higher the
clock frequency, the more dynamic power
is consumed.
In a continuous-time design, the filter
characteristic depends on conventional
active-filter design rules. If the sample rate
is changed to match input-signal bandwidth,
the continuous-time filter must
be retuned. It becomes a real challenge to
ensure that a single product platform can
support a wide range of sample rates. A
further challenge lies in achieving high linearity
in high-resolution implementations,
because the loop filter requires lots of gain.
Continuous-time design was so difficult,
it essentially remained a laboratory curiosity
for decades. But in 2005, Xignal, a fabless
German company, made some breakthroughs.
Then National bought Xignal
and successfully transferred the laboratory
technology to a production technology,
which is no mean feat.
Some of the ADC12EU050’s special
features take advantage of the oversampling
architecture. One example is the
chip’s integrated low-pass, brick-wall antialiasing
filter. That means no external antialiasing
filter is needed. The continuoustime
architecture also means the IC has an easy-to-drive, purely resistive
input stage that, of course,
doesn’t require a sample-andhold
amplifier.
National overcame the continuous-
time architecture’s traditional
susceptibility to clock
jitter with an integrated phaselocked
loop (PLL) and voltagecontrolled
oscillator (VCO) for
clock conditioning. The converters
provide on-chip instantoverload
recovery circuitry that recovers
from saturation within one clock cycle if
the input exceeds pre-determined limits.
LINEAR CREATIVITY
Okay, let’s say you need to design a battery-
powered instrument for measuring
temperature, pressure, or some other sensor-
related characteristic, or maybe even
voltage, at a reasonably slow rate, say, up
to 60 times a second. For battery-operated
applications, Linear Technology and its
16-bit (guaranteed no missing codes) delta-
sigma LTC2451 and LTC2452 ADCs
offer a small footprint (3- by 2-mm dual
flat no-lead package) and low (0.5-µA)
shutdown current.
These devices operate from a single 2.7-
to 5.5-V supply. They even have a built-in
oscillator. The difference between them
is that the LTC2451 communicates via
I2C and can measure a single-ended input
between 0 V and VCC, while the LTC2452
communicates via the serial peripheral
interface (SPI) and can measure a differential
input up to ±VCC.
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Changing converter topologies, the company’s
LTC2366, a 12-bit, 3-Msample/s
SAR ADC, emphasizes a small (TSOT-23)
footprint and low power draw (7.2 mW at
2.6 to 3.6 V). It’s part of a five-member
family that aims to give designers of portable
medical devices and the like a way to
trade off performance for price.
All of the devices in the family communicate
via a serial SPI/QSPI/Microwire-compatible
interface and offer no data latency
while achieving dc specifications of ±1-LSB
integral nonlinearity (INL) and differential
nonlinearity (DNL). The LTC2366 measures
72-dB SNR, –80-dB total harmonic
distortion (THD), and 82-dB spurious free
dynamic range (SFDR) at a 1-MHz input
frequency.
AMPLIFIERS TAKE CENTER STAGE
One way to position analog parts with
respect to performance is to focus on applications.
For instance, EMI can be a headache
in certain apps. An injected RF signal
in a weigh scale can result in as much as 1
V of output offset, which would diminish a
10-bit ADC’s resolution (1024 codes) to a
3-bit effective number of bits (ENOB).
For use in precision weigh scales, as well
as phone accessories, medical instruments,
and other EMI-sensitive industrial electronic
equipment, National recently introduced
the LMV831 single, LMV832 dual,
and LMV834 quad op amps. All of them
integrate EMI filters that deliver a 120-dB
EMI rejection ratio (EMIRR).
Obviously, not every designer may be
familiar with that spec. To help explain
it, National provides app note AN-1698
(www.national.com/an/AN/AN-1698.pdf )
and evaluation boards along with complete
signal-path solutions based on the LMV83x
devices and 10- and 12-bit ADCs with
1-LSB performance SPI or I2C interfaces.
Another instrumentation amp with RF
filtering on the input comes from Texas
Instruments. The company notes that “special
filters have been integrated in series
with the inputs of the INA333 to reduce RF
interference” that can cause offset voltage
variations in weigh scales (Fig. 2). TI goes on
to explain that it focused its design efforts in
the INA333 on combining “long battery life,
low noise, and low offset voltage and drift.”
The chip utilizes a special zero-drift
technology, which incorporates a proprietary
switched-capacitor notch filter to
eliminate chopping noise and provide very
low input voltage noise of 50
nV/Hz. Specifically, the amplifier
is spec’d for 75-µA quiescent
current at 1.8 V. Offset is 25 µV
with an offset drift of 0.1 µV/°C.
Input bias current is 200 pA.
Looking at 16- and 18-bit
precision instrumentation applications
like radar-based collision
avoidance and medical instrumentation,
Analog Devices came
up with the low-noise ADA4898
op amp, which combines low distortion,
low noise, and high speed. ADI acknowledges
that it’s essentially a companion part
for the company’s AD7631 and AD7634
precision data converters.
The ADA4898 uses the same commonmode
linearized input ADI first used in
the AD8099, a circuit designed for low
noise. In the case of the new op amp, that
means ultra-low broadband noise (less
than 1 nV/Hz), 1/f noise of 1.2 nV/Hz
at 10 Hz, low distortion (–110 dBc at 500
kHz), and dc precision that optimizes 16-
and 18-bit ADC performance. At unity
gain, the 3-dB bandwidth is 70 MHz, and
the slew rate is 40 V/µs.
For MRI and digital X-ray systems, key
goals are to reduce the time that patients
must lie motionless during MRI examinations
and reduce X-ray radiation exposure.
With that in mind, Analog Devices engineers
developed the 16-bit, 10-Msample/s
AD7626 successive-approximation ADC.
It achieves a 15-bit ENOB thanks to its
92-dB SNR, which is 8 dB better than
any ADC, regardless of architecture. The
AD7626 additionally wins points on size
(5- by 5-mm quad flat no-lead) and power
consumption (13 mW).
For driving high-performance 14- and
16-bit converters in communications infrastructure
and high-speed instrumentation
equipment, ADI focused on low distortion
in developing its silicon-germanium
(SiGe) ADA4939 differential amplifier,
which consumes less than 120 mW from a
single 3.3-V supply. In terms of distortion,
it achieves 82-dB SFDR at 70 MHz.
The new amp is available in one- and
(for I/Q demodulation) two-channel versions.
The two-channel version also limits
crosstalk to –80 dB at 100 MHz, while
providing gain and phase matching. The
amplifiers can be used in either differential-to-differential or single-ended-to-differential
configurations.
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An internal common-mode feedback loop
allows the user to independently adjust the
output common-mode level to match the
input common-mode voltage of the ADC
as well as achieve exceptional output balance
and suppression of even-order harmonics.
Other key specs include its 2.3-nV/Hz
input voltage noise, 1.4-GHz, –3-dB bandwidth
(G=+2), and 5000-V/µs slew rate.
For quadrature demodulation schemes,
Linear recently announced dual versions of
its LTC6400/LTC6401 differential driver.
The dual LTC6420-20 and LTC6421-20
add guaranteed ±0.25-dB gain matching
and typical ±0.1° phase matching to the
noise and distortion performance of the
original singles. Channel separation is 80
dB at 100 MHz. The LTC6420-20 provides
a fixed gain of 20 dB with –84-dBc thirdorder
intermodulation distortion (IMD3)
at 100-MHz input frequency. Input voltage
noise is 2.2 nV/Hz, including internal
gain-setting resistors.
These amplifiers achieve their distortion
and noise specs on a single 3-V supply
and have rail-to-rail (R-R) output swing.
Thus, the dual ADCs and amplifiers are
able to share the same voltage supply in
many applications. These drivers can drive
an ADC directly without any external output
impedance matching and convert single-ended inputs into differential outputs.
The LTC6420-20 operates from dc to
300 MHz. The lower-power/lower-priced
LTC6421-20 operates to 140 MHz.
In the August 14 issue, I wrote about
Maxim’s MAX2065 fully programmable
analog and digital IF/RF variable-gain
amplifier, which is a nice example of
advanced design (see “RF/IF VGA Chip
Does It All,", ED Online 19427). Maxim packed a linearly
controlled, 31-dB voltage-variable
attenuator; a 31-dB digital step-attenuator;
a 22-dB gain driver amplifier; an 8-bit,
control digital-to-analog converter (DAC);
and a simple SPI-compatible interface into
one chip.
The point was to come up with a virtual
Swiss Army knife for applications in
GSM/EDGE, CDMA, WCDMA, LTE,
and WiMAX receivers. Designers can use
the MAX2065 as either an IF or RF allpurpose
variable gain amplifier (VGA),
interfacing directly with 50- systems
operating anywhere between 50 and 1000
MHz. Each of the three independent RF
stages has its own RF input and RF output,
so the chip can be configured to optimize
either noise figure or linearity (Fig. 3).
Another approach to “high performance”
is to take an intransigent problem that’s
been bugging circuit designers for decades
and solve it for them. That’s what Texas
Instruments did this year with some of its
R-R op amps. The first was the OPA365 in
January, and the latest was the OPA369 in
June. The latter does it with less power.
The basic problem is that the input stage
for most R-R amps consists of a p- and
n-channel differential pair in which offset
voltage depends on the common-mode
input voltage. In other words, there’s a nonlinearity
as the input signal passes through
the crossover point between the two devices,
and that limits the amplifier’s total harmonic
distortion (Fig. 4). To combat the
problem, TI’s chip designers use a charge
pump that boosts the positive supply by
about 2 V to supply the input tail current
for a pMOS differential pair on the input.
In the OPA369, this approach delivers
an offset voltage of 750 µV over the entire
R-R input range and a common-mode
rejection ratio (CMRR) of 100 dB minimum,
maximizing the usable input dynamic
range for low-supply-voltage applications.
Other features include an input voltage
noise density of 120 nV/Hz, a 12-kHz
gain-bandwidth, an input bias current of
50 pA maximum, a voltage offset drift of
1.75 µV/°C (max), a power-supply rejection
ratio (PSRR) of 94 dB, and 1/f noise
of 3.6 µV p-p from 0.1 to 10 Hz.
The OPA369 offers the precision, low
power, and small packaging required in a
wide variety of applications. These range
from portable medical devices (glucose
meters, oxygen metering), portable instrumentation
(gas detection/monitoring), and
sensor signal conditioning to fitness-related
portable consumer equipment, cellular
phones, and handheld test equipment.
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