Author - Chia Wen Liang

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Chia Wen Liang	Write for Electronic Design
Chia Wen Liang is the deputy director of the CRD Logic Division and head of 45-nm development at UMC.
1 results found for Chia Wen Liang, displaying items 1 - 1

May 10, 2007 [TechView: Digital]
Design Tip: Overcome The Challenges Of 45-nm Design
The industry is moving to the 45-nm process technology node. As with the 65-nm node, this migration will be pioneered by foundries partnering with first-tier movers such as large fabless companies and integrated device manufacturers (IDMs). The move to 45 nm, regardless of the application (e.g., FPGA or RF), poses a number of challenges. Increased process complexity to boost device performance: Since traditional device scaling methods can no longer be...