Author - Chris Allsup

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Chris Allsup	Write for Electronic Design
Chris Allsup, marketing manager for test automation products at Synopsys, earned a BSEE degree from U.C. San Diego and an MBA degree from Santa Clara University. He has authored numerous articles describing the economic principles underlying scan compression. Email address: Chris.Allsup@synopsys.com
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August 2, 2007 [Design View / Design Solution]
The Benefits—And Hazards—Of Scan Compression
IC designers now have a powerful weapon in the struggle against rising test costs: commercially available EDA solutions that provide fast and effective means to implement scan compression on-chip. By reducing the amount of data needed to thoroughly test digital circuits, compression frees up enough tester memory to add tests (e.g., transition delay pattern sets) that further improve quality. Because off-the-shelf tools have become increasingly automated and easier to...