Won-Young Jung is the CTO and founder of Nanno Solutions in Sunnyvale, Calif. He has spent 19 years in the process, T-CAD, and design automation industries with companies on both sides of the Pacific. His career includes research and managerial stints with LG Semiconductor, Aspec Technology, and Cadence Design Systems. Since 2004, Jung has been executive VP/CTO at Nanno Solutions. He’s authored 29 technical papers and holds a total of 31 patents (with another pending) in the U.S., Japan, Germany, Taiwan, and Korea. Email address: wyjung@nannosolutions.com
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August 16, 2007[Technology Report] Design Flows Must Evolve Toward DFM Awareness
Our current concept of DFM is not really manufacturing-aware. With designs scaling down to 130 nm and below and process complexity increasing correspondingly, the impact of process-induced variation on interconnect becomes more dramatic. To ensure the circuit's robustness against these manufacturing-induced (or process-induced) variations, two things must happen. First, the designer must consider worst-case device models, as well as worst-case interconnect models,...
