Chester Simpson is a principal engineer, Power Management Group, at National Semiconductor Corp., Santa Clara, Calif. He holds a degree in education from Cosumnes River College, Sacramento, Calif., and a BSEE with honors from California State University at Sacramento. Email address: chester.simpson@nsc.com Web site: http://www.nsc.com
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April 10, 2008[Ideas For Design] Fast Load Transient Tester Circuit Features Adjustable Slew Rate
Performance under transient loads has become the most important specification of voltage regulators used to power a wide array of products whose current demands vary quickly during operation. Testing transient performance requires a load that can be programmed to change at different rates. Expensive electronic loads are available, but I found none that could supply a load that changes faster than 0.4 A/µs, which is too slow to...
