Author - Yosi Stein

Technologies
- Analog
- Communications
- Components
- Digital ICs
- EDA
- Embedded
- Power
- Test
Design Hotspots
- Analog
- Embedded
- Power
- Green Design
Resources
Shows
- ESC 2009
- Embedded World 2009
- APEC
- CES
- electronica
- NI Week
- MTT-S
- DAC
- MD&M
- PCIM
Magazine
eBooks & Whitepapers
Jobs
More...
- eBooks
- Whitepapers
- Webcasts
- Job Zone
- Newsletters
- Blogs
- Hall of Fame
- RSS
- Subscribe

Click to view this week's ad screen

Yosi Stein	Write for Electronic Design
Yosi Stein is a principal system architect/advanced technologies manager with Analog Devices Inc. He holds a BSc in electrical engineering from Technion-Israel Institute of Technology, Haifa. Email address: yosi.stein@analog.com Web site: http://www.analog.com
1 results found for Yosi Stein, displaying items 1 - 1

March 26, 2009 [Design View / Design Solution]
Improve Integrated SRAM Reliability With Hamming Error-Correction Code
Many error-correcting codes (ECCs) are proposed in the industry’s literature for correcting bit errors present in the received data. We will discuss Hamming codes that are used to correct singlebit errors and detect all double-bit errors that could occur during data transmission or residing in the memory. How much improvement we can get in the bit-errorrate (BER) performance curves using onebit error correction depends on the raw BER (RBER) without error...