104 results found for TechView: Test, displaying items 1 - 20
November 18, 2009
Modular Test Standard Builds On ATCA, PXI, LXI, And IVI
Does the world really need another modular test standard? Ready or not, here comes AdvancedTCA Extensions for Instrumentation and Test (AXIe). Proposed by the trio of Aeroflex, Agilent Technologies, and Test Evolution Corp., AXIe is an open standard based on AdvancedTCA (ATCA) that aims to extend that standard into the realm of general-purpose and semiconductor test.
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David Maliniak
November 10, 2009
PXI Instrumentation Suite Stands Up To Mixed-Signal Semiconductor Test Challenges
National Instruments has launched a series of PXI-based modular instruments that combine with the company’s LabVIEW software to create a highly flexible system that shines with analog/mixed-signal test, where stimuli types can be out of the ordinary (think MEMS test), volumes are extremely high, and test costs must be correspondingly low.
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David Maliniak
October 20, 2009
Scope Delivers High Signal Fidelity To 20 GHz
As the performance levels of embedded systems escalate, the tools required to verify and debug them must keep pace. Most designers need to examine analog and digital signals simultaneously, with many dealing with memory buses in terms of integrity and timing. Combining the probing attributes of a high-performance logic analyzer with the analog capabilities of a real-time scope, the MSO70000 series is Tektronix’s take on a mixed-signal scope that’s up to the challenge.
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David Maliniak
September 30, 2009
Signal Analyzers Cover Both Ends Of The (Cost) Spectrum
Adding to the high and low ends of its spectrum-analyzer family at the same time, Agilent has covered the bases with the launches of its N9000A CXA low-cost analyzers and its N9030A PXA high-end instrument. In both cases, as in all members of the company’s X series signal analyzers, the instruments are consistent in terms of their measurement framework and their ability to enable design teams to grow with them.
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David Maliniak
September 23, 2009
Spectrum Analyzer Delivers Unprecedented Ku-Band Performance
The Tektronix RSA6120A spectrum analyzer incorporates a feature set that targets digital-RF designers working in the Ku-band frequencies (12 to 18 GHz). It offers extremely high spurious-free dynamic range of 75 dB in the Ku-band, an enhanced set of radar measurements, and switched-filter preselection that overcomes the limitations of earlier spectrum analyzers.
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David Maliniak
July 28, 2009
Low-Cost MSO Offers 16 Digital Channels
With the MSO3000 mixed-signal oscilloscope (MSO) series from Tektronix Inc., designers can visualize and analyze analog, digital, and serial signals on a single instrument. These devices offer up to four analog and 16 digital channels, 100- to 500-MHz bandwidth, 5M record length, and a 2.5-Gsample/s analog sample rate for system debug.
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Staff
March 19, 2009
Comprehensive Test Suite Eases Transition To DDR3 Memory Architectures
To address the needs relative to DDR3 design and integration, Agilent is offering a comprehensive DDR3 protocol test package that will span probes and slot interposers, a high-speed logic analysis module, and compliance and analysis software tools. At the center of the offering is the 16962A logic analysis module, billed as the industry’s fastest with support for state speeds up to 2 Gtransfers/second. Timing speed is specified as up to 8 GHz (quarter channel; up to 400 Msamples deep).
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David Maliniak
October 21, 2008
Faster AWG Tackles High-Speed Serial Data And Wideband Digital RF Designs
When designing new products based on faster high-speed serial buses like PCI Express (PCIe) 2.0 and 3.0, SATA Gen 3, SAS, HDMI 1.3, and DisplayPort, a quality signal source is needed to create actual real-life signals with all their imperfections like distortion, noise, jitter, and glitches. The same is true for broadband RF applications. Tektronix’s AWG7000B and AWG5000B AWGs meet these needs with a 20% increase in performance over their previous models.
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Louis E. Frenzel
October 21, 2008
Software Combines Equipment And Automation To Improve Productivity And Quality
Most vendors and their carrier customers test their networking equipment manually. But with the size and complexity of some systems, testing can be a long and drawn-out process. This is especially true for paranoid service providers who want to test everything to ensure quality and a good subscriber experience. The testing process not only is time consuming, it’s also very expensive. Fanfare’s iTest 3.2, though, promises to speed up and simplify that process.
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Louis E. Frenzel
October 9, 2008 Data-Logger Trio Handles Heat, Pressure, And Budgets
Targeting temperature and pressure data-logging applications across a wide range of industries, Omega Engineering offers a number of cost-effective solutions. Whether in the field or in house, these instruments pair comprehensive feature sets with cost-effective pricing. Described as a precision resistance temperature detector (RTD) temperature recorder, the OM-CP-RTDTEMP2000 has one of the largest memory capacities of any similar data ...
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Mat Dirjish
September 25, 2008
Low-Cost Oscilloscope Offers High-Priced Features
The WaveAce oscilloscopes from LeCroy makes the competition in the low-cost scope market look so “yesteryear.” These devices bring high-end scope features like color and long sample memory storage to the value scope market.
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Louis E. Frenzel
September 25, 2008 PXI Modules Provide Higher Frequencies, Speed, And Flexibility
At last month’s NIWeek conference in Austin, Texas, National Instruments introduced several RF products that are sure to be a hit with some engineers because of their higher frequency range, faster speeds, and lower costs. With RF testing becoming a larger part of the design and production testing of wireless technologies, these devices could yield faster time-to-market while decreasing test costs. NI also rolled out a line of Wi-FI testers...
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Louis E. Frenzel
August 14, 2008 Updated Signal-Generation Software Uses Click-And-Drag GUI
Keithley Instruments has launched the 2.0 version of its SignalMeister Waveform Creation Software. Introduced last year, the original version of the software tool lets engineers create highly complex signals needed to test modern RF and wireless products. With SignalMeister, designers can create waveforms for multiple signal standards and add signal impairments and channel modeling. The created waveforms are downloaded to Keithley’s 2900 series RF...
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Louis E. Frenzel
July 25, 2008
Handheld Real-Time Spectrum Analyzers Nail Interfering Wireless Signals Fast
Complex wireless technologies make measurement a real challenge with their short bursts and non-deterministic timing. Furthermore, identifying and locating interfering RF emitters that are misusing the radio spectrum has become more of a challenge. Yet Tektronix’s SA2600 and H600 Hawk Real-Time Spectrum Analyzers can meet both of these measurement challenges.
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Louis E. Frenzel
July 25, 2008
Software Options Make Good Spectrum Analyzers Even Better
New options are available for Anritsu’s popular MS271xB economy microwave spectrum analyzers. The three available models have upper frequency limits of 7.1, 13, and 20 GHz. They also have a 10-MHz demodulation bandwidth and support the most common 3G cell-phone and WiMAX standards.
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Louis E. Frenzel
June 6, 2008
MELs Make Power-Source Testing Faster And Easier
How do you test a very high-current and/or high-voltage power source? You measure the voltage, current, and power, but you need to test the source under typical and maximum load conditions. So what do you use for a load, especially if it must dissipate up to tens of kilowatts? The MEL series of modular electronic loads from PPM Inc. can handle up to 60 kW in one 8-ft rack.
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Louis E. Frenzel
June 6, 2008
GPS Satellite Signal Generation Simplifies Nav Receiver Testing
The GPS Toolkit from National Instruments is a software accessory for the company’s popular LabVIEW program. In conjunction with NI’s PXIe-5672 or PXI-5671 RF vector signal generators, it can simulate up to 12 simultaneous GPS satellite signals with varying conditions.
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Louis E. Frenzel
June 6, 2008
Solar-Array Simulator Imitates Satellite Environmental Conditions
Some things are really tough to test. For example, how do you simulate the solar panels on a satellite under varying light and orientation conditions? Well, Agilent’s E4360 Solar Array Simulator accurately simulates the I-V curve of a solar panel’s array under various environmental conditions.
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Louis E. Frenzel
June 6, 2008
Handbook Provides The Fundamentals Of Switching In Test Systems
Most test systems today require switching to reconfigure the test setup to make multiple different tests and measurements. This isn’t something you learn in school. Fortunately, Keithley Instruments’ Switching Handbook: A Guide to Signal Switching in Automated Test Systems consists of up to 180 pages of practical tutorial information on how to set up and optimize switching test systems.
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Louis E. Frenzel
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