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Test & Measurement Technical Features

  • What’s The Difference Between Watts And Volt-Amperes?

    What’s The Difference Between Watts And Volt-Amperes?

    By Gary Raposa, May 02, 2012

    Knowing the difference between watts and volt-amperes can help with many calculations regarding an electric circuit. Grab a multimeter and start measuring electric power.

  • 6-GHz Signal Generators Support Wireless Design

    6-GHz Signal Generators Support Wireless Design

    By David Maliniak, May 02, 2012

    Agilent's X-Series signal generators aid in design of RF/wireless systems for LTE and/or 4G applications.

  • Agilent Fires Latest Shot In The Scope Bandwidth War

    Agilent Fires Latest Shot In The Scope Bandwidth War

    By David Maliniak, April 11, 2012

    At 63 GHz, Agilent's 90000 Q-Series real-time oscilloscopes offer the world's highest bandwidth. If you need to see the third harmonic of a 40-Gbit/s digital signal, this is the scope for you.

  • T&M Supports The Medical Industry’s Transformation

    T&M Supports The Medical Industry’s Transformation

    By Jessy Cavazos, April 10, 2012

    The healthcare industry is changing rapidly; test and measurement must change as well to support its growth. Jessy Cavazos highlights the trends in medical and how test must respond to keep pace.

  • What’s The Difference Between A Mixed-Signal Oscilloscope And A Logic Analyzer?

    What’s The Difference Between A Mixed-Signal Oscilloscope And A Logic Analyzer?

    By Joel Woodward, April 04, 2012

    Logic analyzers and oscilloscopes have coexisted for many years and test-equipment vendors can sell you either one or the other. Which one is best for you? Agilent's Joel Woodward cuts to the chase by laying out the distinctions between them.

  • Heterogeneous 3D IC Test Vehicle Uses CoWoS Process

    Heterogeneous 3D IC Test Vehicle Uses CoWoS Process

    By Paul Whytock, April 03, 2012

    Altera Corp. and the Taiwan Semiconductor Manufacturing Company (TSMC) have jointly developed the world’s first heterogeneous 3D IC test vehicle using TSMC’s Chip-on-Wafer-on-Substrate (CoWoS) integration process.

  • Conquer The Challenges Of High-Current Pulses

    Conquer The Challenges Of High-Current Pulses

    By Bob Zollo, March 30, 2012

    Maintaining your bench supplies' output voltage in the face of rapidly changing or pulsed current draws is a stiff challenge. Agilent's Bob Zollo has some thoughts on how to solve the problem.

  • Old Scopes versus new: new isn’t necessarily better

    Old Scopes versus new: new isn’t necessarily better

    By David Maliniak, March 29, 2012

  • Digital/Mixed-Signal Scopes Address The Data  Dilemma

    Digital/Mixed-Signal Scopes Address The Data Dilemma

    By David Maliniak, March 29, 2012

    With the proliferation of high-speed serial buses, designers need ever more capable debug tools at the ready. Today's digital and mixed-signal scopes have evolved into multi-functional debugging machines built to give deep insight into digital signals.

  • Get More Out Of Your Digital Oscilloscope

    Get More Out Of Your Digital Oscilloscope

    By Michael Lauterbach, March 23, 2012

    Most users of digital storage scopes don't really use much of their instrument's capabilities and many could benefit from a tutorial on the fine points. LeCroy's Dr. Mike Lauterbach has the cure for what ails you in this article.

  • The Fundamentals Of Spectrum Analysis

    The Fundamentals Of Spectrum Analysis

    By Erik Diez, March 22, 2012

    We know that spectrum and vector signal analyzers give us deep insight into a signal's properties, but do we really know what's going on under the hood? What are we to make of all those specifications? Agilent's Erik Diez goes through the basics to help you get more out of your spectrum analyzer.

  • Four 1GHz Scopes Added To InfiniiVision 3000 X Series

    Four 1GHz Scopes Added To InfiniiVision 3000 X Series

    By Staff, March 22, 2012

    Agilent expanded its InfiniiVision 3000 X Series of oscilloscopes with four 1GHz models, doubling the available bandwidth for this family.

  • Analyse CAN/LIN Signals At Protocol Layer

    Analyse CAN/LIN Signals At Protocol Layer

    By Staff, March 22, 2012

    The K3 triggering and decoding option developed by Rohde & Schwarz for its RTM series allows CAN and LIN signals to be viewed at the protocol layer.

  • Green-Power Push Leads To High-Voltage SMU

    Green-Power Push Leads To High-Voltage SMU

    By David Maliniak, March 22, 2012

    Next-generation power semiconductors based on SiC and GaN pose measurement challenges. Keithley Instruments' Model 2657A high-power source-measure unit (SMU) tackles them head-on.

  • Regulatory  Challenges  Complicate Test  For Medical  Technologies

    Regulatory Challenges Complicate Test For Medical Technologies

    By David Maliniak, March 13, 2012

    High-voltage test concerns and a changing regulatory landscape are the dominant issues in test of medical devices and equipment.