1011 results found for Test & Measurement, displaying items 1 - 20
April 25, 2008
[ESC 2008] LeCroy Expands M-Type Scope Line
LeCroy Corp. has added six new models ranging from 200 MHz to 2 GHz to its M-Type oscilloscope line. The WaveRunner MXi and WaveSurfer MXs scopes come standard with a full set of analysis tools including WaveScan, an advanced search and analysis feature. This technology also has WaveStream, a fast viewing mode, and LabNotebook, a tool for documentation and report generation.
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ED News Staff
April 25, 2008
[Technology In The News] Johns Hopkins Provost Wins Top Engineering Award
The American Association of Engineering Societies has awarded the John Fritz Medal to Kristina M. Johnson, provost and senior vice president for academic affairs at The Johns Hopkins University. Previous winners of the award, widely considered to be the highest in the engineering profession, include Thomas Edison, Alexander Graham Bell, George Westinghouse, and Orville Wright.
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Staff
April 24, 2008[POV: Point Of View] High-Speed Serial Data And RF Wireless Dominate Today's T&M
Two key areas of electronics are driving the development of new test and measurement (T&M) instruments—high-speed serial buses and wireless test. Both require very high-frequency capability as well as the ability to support the many standards that are being developed. CIRCUITS AND PACKETS There is a movement in digital design, from parallel bus structures to serial buses at microwave frequencies, with the growing set of T&M...
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Carla Feldman
April 24, 2008[TechView: Analog & Power] Single Chip Digitizes High-Side Power Measurements
Single Chip Digitizes High-Side Power Measurements In-circuit power measurements frequently involve a currentsense amplifier or a hot-swap controller and an analog-todigital converter (ADC). Optimally, the current sensing is done on the high side of the load to avoid false grounds. But one problem with that approach is the presence of a high common-mode voltage on the amplifier input. Another is the typical ADC’s limited input voltage range. In addition, the cost of...
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Don Tuite
March 20, 2008
[Technology In The News] Agilent Eliminates Need For Physical Test Points For ICT
Agilent Technologies’ new Cover-Extend Technology is a hybrid between two established test methods for manufacturing test: boundary scan and VTEP vectorless test. Part of the company’s VTEP v2.0 Powered test suite, Cover-Extend offers a limited-access solution for in-circuit test (ICT) users that eliminates the need for physical test points, providing benefits that traditional VTEP cannot.
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ED News Staff
March 17, 2008
[TechView: Test] Embedded Waveform Viewing Improves Signal Integrity Testing Without An Oscilloscope
Buses and backplanes keep getting faster. Ethernet now runs at 10 Gbits/s, and the XAUI interfaces are at 3.125 and 6.25 Gbits/s. Blade server serial buses like PCI Express are moving from 2.5 to 5 Gbits/s. The SAS and SATA interfaces are increasing from 1.5 to 3.0 to 6.0 Gbits/s. Fibre Channel is now at 8 Gbits/s. And, digital video is increasing from 1.5 to 3.0 Gbits/s as 1080p HDTV becomes more popular.
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Louis E. Frenzel
March 17, 2008
[TechView: Test] SATA Gen-2 PHY Compliance Test Framework And Software Shortens Test Time By 70%
The latest generation of Serial ATA (SATA), the serial interface for disk drives (Gen-2), now runs at 3 Gbits/s. To meet the compliance requirements known as the Methods of Implementation (MOI) of the SATA-IO working group, a new product has to pass 153 specific tests. These tests are complex and time consuming, and they add extra cost to every new product manufactured. Tektronix is addressing this challenge with its TekExpress SATA Gen-2 test package.
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Louis E. Frenzel
March 14, 2008
[Designed In] G Systems Designs Simulation Unit For Missile Tester
G Systems has delivered a new Console Simulation Unit (CSU) to Lockheed Martin for use in the U.S. Army’s Multiple Launch Rocket System (MLRS) Soldier-portable Test Program Set. The CSU was developed under a contact from Lockheed Martin Missiles and Fire Control to create an automated test system to replace an existing labor-intensive, manually operated test instrument.
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ED News Staff
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