View this week's entry ad »
Part Inventory
powered by:
Part Finder
Go
powered by:
  • Quick Poll
What Social Networking site do you use the most?



VOTE VIEW RESULTS
Previous Polls
Hotspots » Analog & Mixed SignalPowerEmbedded

Premium Content

Editors' Picks

Featured Industry Resources

"New" Approaches To Wireless Test

The SDR architecture is just one of the technologies applied to help speed and simplify complex measurements.

By Louis E. Frenzel, Louis E. Frenzel

October 11, 2007

Print
Reprints Comment Subscribe

With frequencies soaring to new heights, wireless and RF testing gets pushed to the limit in terms of complexity and cost. In fact, higher frequencies in the gigahertz range are now commonplace. Simple AM and FM/PM have disappeared, replaced by the more complex digital modulation methods.

Binary phase-shift keying (BPSK), quadrature phaseshift keying (QPSK), and quadrature amplitude modulation (QAM) are the norm these days. And, cell phones extensively exploit spread-spectrum (CDMA) technology. Meanwhile, other newer wireless methods have switched to orthogonal frequency-division multiplexing (OFDM).

Specialized wireless techniques like software-defined radio (SDR) and cognitive radio (CR), time-multiplexed protocols, bursty transmissions like radar, frequency hopping, wide-bandwidth technologies like Ultra-Wideband (UWB), and adaptive modulation further complicate the testing process. It isn't a pretty picture for the designer or the test engineer.

But that's not all. Testing speed is more important than ever before. Time-to-market still rules the roost in engineering today, and testing adds no value. It's just a cost borne to ensure that the product works and conforms to the guidelines in play. The more time spent in manufacturing testing, the greater the cost and the lower the margin.

That's a grim scenario in a high-volume commodity market like cell phones. With over 1 billion new phones produced this year alone, just think of the hours that go into testing. One manufacturer indicates that cutting the test time for one measurement by 10 ms can save $1 million in a production run.

On that front, though, there's some really good news. Test equipment manufacturers, always on the leading edge of technology anyway, recognized the problem and produced some excellent solutions that simplify and significantly accelerate testing procedures - at a price. Yet that price is a good tradeoff because time is, after all, still money.

Common Tests
When planning your wireless testing, make sure the standards of the technology you're using spell out the key parameters of what you want to measure. Whether the standard comes from an international standards organization or an industry alliance that certifies products, you must acquire that standard documentation and become aware of all its gruesome details. Here, you'll find the specific tests that need to be made as well as the required equipment.

Keep two facts in mind. First, RF measurements are measurements of power, not voltage. Meters and displays readout in power directly or, in some instances, in dBm (dB referenced to 1 mW). Table 1 shows the relationship between actual power and dBm. Since the goal in all cases is maximum power transfer, proper impedance matching within your circuits and between the test instruments and the device under test (DUT) is critical. Most RF measurements are made with a 50-Ω characteristic impedance.

Second, everything is a transmission line. If it isn't a coax cable, it's a strip line or microstrip whose impedance is crucial. Again, 50 Ω is the standard, and all impedances should match up for maximum power transfer. Also, impedances should match to minimize reflections and high voltage standing-wave ratio (VSWR), which can lead to inefficiency and circuit damage.

Generally, RF tests divide into two categories: those for transmitters (TX) and those for receivers (RX). Many other special tests exist, and beyond the ones listed below, companies consistently develop new tests to add to the mix (see "Six New Measurements You're Going To Need" at www.electronicdesign.com, Drill Deeper 17102).

Transmitter Tests
Output Power:
The most important test is power output from the final power amplifier (PA). You can get a good measurement by using a spectrum analyzer or vector signal analyzer, though in most cases, greater accuracy of measurement is essential. This requires an RF power meter. It will give you the accuracy needed to ensure compliance with whatever standard or regulation you must meet.

The two common power measurements are average and peak. Your needs will be determined by the type of modulation you're using. A further complication is the requirement of a gated or timed power measurement in some applications. For example, the GSM cell-phone standard that uses TDMA requires you to measure the power in a burst of RF during the 524.6-µs time slot allotted. Another example of a pulsed RF application is radar, which has very narrow pulses and random and sometimes coded formats.

With CDMA, you will measure average power because the signal is similar to random or white noise. In a CDMA PA that must handle multiple signals concurrently, the signals (though random) can add together and produce higher power peaks 10 to 30 times that of one signal. A key measurement in such amplifiers is the crest factor, or the peak-to-average ratio, which may be a power or voltage ratio. Some RF power meters will measure and calculate the crest factor.

Another key measurement is the PA's 1-dB compression point. As the input power to a PA increases, the output increases linearly, up to a point. At some power level, the output will saturate, meaning the output power will max out and remain essentially constant despite increasing input power (Fig. 1). The 1-dB compression point is the point where the output power becomes 1 dB lower than what it should be on a linear output scale.

Of course, driving an amplifier into saturation stresses it. Even worse, the nonlinear response will produce harmonics and spurious signals resulting from intermodulation-distortion (IMD) effects. You can measure the harmonics and spurious signals with a spectrum analyzer.

Continued on Page 2

Average ( Ratings):
Filed Under:

Check for price and availability on Source ESB:

Go
powered by  

Related Products

You must log on before posting a comment.

Are you a new visitor? Register Now

Acceptable Use Policy

Sponsored Links