This seminar is designed to introduce the topic of C-V measurements as they relate to semiconductor device and materials characterization. C-V testing is commonly used to determine semiconductor parameters such as doping profiles, density of interface states, threshold voltages, oxide charge, and carrier lifetime.
What you will learn:
- What is C-V testing
- What types of devices can C-V testing be used to characterize
- Who can use C-V
- C-V measurement challenges
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