Electronic Design
Electronic Design Europe
Microwaves & RF
Power Electronics Technology
Source ESB
Mobile Dev & Design
Engineering TV
Electronic Design
View this week's entry ad
Subscribe
Contact
Register
Sign In
Search
Home
»
Test & Measurement
» Test For RF Trends
Channels
Analog & Mixed Signal
Amplifiers
Data Converters
Discrete semiconductors
Controllers
Analog Switches
Power
Regulators
Discrete semiconductors
Drivers
Protection ICs
Power management/ controller ICs
DC/DC converters
Battery ICs
Charge Pumps
Power Quality
High Voltage Converters
One Powerful Day
Digital
Processors/Controllers
Video ICs
Audio ICs
Programmable Logic Devices
Standard Logic
Memory
System on Chip (SoC)
Interface ICs
Lab Bench
Communications
Wireless
Wired
Fiber Optics
Components
Cabinets
Enclosures
Cooling Products
Displays
Interconnects
Wire & Cable
Motors
Passive Components
Power Sources
Sensors
Transducers
Switches
Relays
Solenoids
Input Devices
Timing Devices
Circuit Protection Devices
Output Devices
MEMS
Packaging
Indicators & Lighting
LEDs and Solid State Lighting
Test & Measurement
Digital Signal Oscilloscopes (DSOs)
Logic Analyzers
Spectrum Analyzers
Communications Test Equipment
Bench-top Power Supplies
Meters (Includes DMMs, voltmeters, etc.)
PC-Based Instruments
EMI/EMC Test Equipment
Test & Measurement Accessories (probe, etc.)
Emulators/Debuggers (Hardware)
JTAG
Automated Test Equipment (ATE)
Test Bench/Test Executive Software
Instrument GUIs (O-scopes, logic analyzers, etc.)
EDA
Computer-Aided Engineering (CAE) Tools
PCB and MCM layout tools
IC physical design and verification tools
Embedded
Development Tools
Programming Languages
Operating Systems
Frameworks
Protocol Stacks
Middleware
Boards, Modules & Systems
Bill's Workbench
Embedded In ED
Part Inventory
Go
powered by:
Quick Poll
What Social Networking site do you use the most?
Facebook
LinkedIn
MySpace
Twitter
Digg
VOTE
VIEW RESULTS
Previous Polls
Top Articles
Most Emailed
Most Commented
What's The Difference Between IPv4 and IPv6
What’s the Difference Between 3G and 4G Cellular Systems?
Behind the Scenes at CES 2012
Understanding Modern Digital Modulation Techniques
Does Wi-Fi Put Danger In Your Pocket?
What’s All This Spicey Stuff, Anyhow? (Part I)
Tools Enable More Analog Innovation In 2012
Automotive ICs Keep Catastrophes At Bay
High-Power LED Modules Demand Specialized Electrical Test Tools and Techniques
Formal Techniques for Protocol Verification: A Case Study On Verifying the ARM ACE Protocol
What's The Difference Between IPv4 and IPv6
What’s the Difference Between 3G and 4G Cellular Systems?
Behind the Scenes at CES 2012
Understanding Modern Digital Modulation Techniques
Does Wi-Fi Put Danger In Your Pocket?
What’s All This Spicey Stuff, Anyhow? (Part I)
Tools Enable More Analog Innovation In 2012
Automotive ICs Keep Catastrophes At Bay
High-Power LED Modules Demand Specialized Electrical Test Tools and Techniques
Formal Techniques for Protocol Verification: A Case Study On Verifying the ARM ACE Protocol
What's The Difference Between IPv4 and IPv6
What’s the Difference Between 3G and 4G Cellular Systems?
Behind the Scenes at CES 2012
Understanding Modern Digital Modulation Techniques
Does Wi-Fi Put Danger In Your Pocket?
What’s All This Spicey Stuff, Anyhow? (Part I)
Tools Enable More Analog Innovation In 2012
Automotive ICs Keep Catastrophes At Bay
High-Power LED Modules Demand Specialized Electrical Test Tools and Techniques
Formal Techniques for Protocol Verification: A Case Study On Verifying the ARM ACE Protocol
Premium Content
New Signal Chain Technical Papers from Texas Instruments:
Analog Signal Chain Guide.
Download now
.
TI's New 2011 Audio Guide.
Download now
.
TI's Motor Solutions Guide.
Download now
.
Test For RF Trends
Highlights
Tweet
Roger Allan
January 12, 2006
Share
Email
Print
Reprints
Comment
Subscribe
Crowding of the RF spectrum caused by a multitude of wireless communications devices creates challenging issues for RF test equipment manufacturers.
Traditional RF test equipment keeps moving forward in performance. However, more needs to be done as clock rates rise and the line blurs between digital and analog signals.
PC-based hardware plug-in cards are becoming more popular, leaving the PC to perform most of the computational tasks via software.
A software-based approach to T&M is gaining a foothold. Virtual instrumentation and synthetic instruments are the latest trends to suppress testing costs.
The RF ATE industry must develop higher-speed and lower-cost systems, as well as meet the requirements of cellular devices with multiple standards and protocols.
Average (0 Ratings):
Tweet
Subscribe
Subscribe to Electronic Design and start receiving more articles like this one
Filed Under:
Check for price and availability on Source ESB:
Go
powered by
Comments
Add A Comment
Electronic Design
There are no comments to display. Be the first one!
You must
log on
before posting a comment.
Are you a new visitor?
Register Here
Acceptable Use Policy
Sponsored Links