Ultra-high-frequency design poses plenty of challenges, but nowhere are the challenges more daunting than in test and measurement. Frost and Sullivan's Jessy Cavazos explains why.
NI's Richard McDonell outlines a vision for test and measurement as a shape-shifting technology that readily adapts itself to the task at hand. Abstraction and modularity are the keys.
When your bench supply's capacitors are all charged up with nowhere for that charge to go, an active down-programmer is a handy technique that brings rise and fall times back into a viable range.
Wideband modulation in 60 GHz communication. Read now.
Testing transmitters and receivers with pulsed ultra-wideband signals. Read now.
Creating a Radar Threat Simulator and Receiver Calibrator with Precise Angle of Arrival. Read now.
Learn about the powerful capabilities of the Tektronix MDO Series to debug today’s complex designs, and the unique architecture that enables it all.
By Bob Zollo, February 07, 2012
By David Maliniak, February 02, 2012
Agilent's 86108B waveform analyzer module combines with its 86100C/D mainframe to comprise a sampling capable of characterizing high-speed designs out to 32 Gb/s.
By Chris Loberg, January 24, 2012
The move is underway to coherent optical fiber for long-haul dense wavelength division multiplexing (DWDM). Here's what you need to know to test and optimize these optical networks.
By David Wyban, January 20, 2012
Test of high-power LEDs (HPLEDs) is a trickier affair than of ordinary LEDs, involving pulse-width modulation. Keithley's David Wyban covers use of source-measure units for this application, as well as special cabling considerations.
David Maliniak
Presented By Ironwood Electronics
Presented By Keithley
Test & Measurement / Eric Starkloff
Analog/Mixed-Signal Design / Dave Van Ess
Commentary / David Maliniak