By Don Tuite, August 30, 2010
By Louis E. Frenzel, November 05, 2007
The testing of any new wireless receiver design usually requires conventional test instruments such as a vector signal generator and appropriate output instruments like a scope, vector signal analyzer, or spectrum analyzer. But t
By Daniel Harris, October 25, 2007
As field-programmable gate arrays (FPGAs) continue to drop in price while adding significant capability, their use has expanded greatly in industrial control and monitoring applications. And since FPGAs are in-system/field-programmable
By Bill Murray, May 24, 2007
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By William Wong, March 29, 2007
Complex homogeneous systems are common in server environments that use symmetrical multiprocessing (SMP) or clusters of similar platforms. Yet complex embedded systems frequently incorporate different and even unique platforms. When it comes to d
By Louis E. Frenzel, February 15, 2007
Measuring current is always a nuisance because you have to break the circuit to put the measuring device in series with the circuit. That problem never goes away. Still, any high-end digital multimeter can accurately measure currents down into the microam
By William Wong, November 16, 2006
PXI Express is prepared to move test and measurement into the next decade. It builds on the PXI standard, offering higher performance and backward compatibility. As PXI was based on the PCI bus, PXI Express is built on the PCI Express high-speed
By William Wong, September 01, 2006
Most programmers have a favorite text-based programming language. Some programmers even get rather vocal when it comes to defending their favorite's pros and cons. In fact, the only thing that most programmers can agree upon is that it's a good idea to av
By William Wong, July 20, 2006
A SIC design isn't for the faint of heart. Success requires expertise, and the challenges increase with the movement to submicron designs. Yet with the complexities of ASIC design, customers will often leave performance on the table. Partnering with an
By Roger Allan, July 06, 2006
T est & measurement (T&M) users face greater challenges in configuring their systems to optimally suit their testing needs. Contributing to these challenges has been the availability of a bewildering array of test equipment for a growing number of
By Louis E. Frenzel, May 11, 2006
Wireless ubiquity?even if we aren't quite there yet, we soon will be. The number of wireless technologies developed and implemented over the past decade is astonishing. Cell phones definitely top the list of key applications, but there are so many others.