Joe Desposito
Mat Dirjish
William Wong
By David Hall, May 25, 2012
National Instruments' David Hall shows you how to augment microwave spectrum analysis with PC-based test equipment, model extraction, and hardware-in-the-loop (HIL) simulations to improve your wireless design process.
By David Maliniak, May 25, 2012
Building a modular test strategy can provide great flexibility in capabilities, or the system can be tailor-made for specific requirements. Often a hybrid approach encompassing traditional box instruments is best. Here are some basics to consider in formulating an approach that will work best for you.
By Daniel Gallant, May 24, 2012
Getting the best performance from the PCI Express interface requires careful selection of the clocking method.
By Lou Frenzel, May 24, 2012
Soitec's new fully depleted wafers use silicon on insulator technology to implement smaller feature devices down to 20 nm.
By Daniel Herzog, May 24, 2012
First found decades ago in chicken brooders, these components still are effective in applications ranging from soda machines to submarines.
David Hall
Tom Curatolo
Paul Whytock
Our editors report on the latest developments in LEDs for lighting and other applications.
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Electronic Design Europe