Summary

Lee Stauffer, Keithley Instruments, Inc.

The need for greater test efficiency and productivity has never been more urgent in the semiconductor industry. Changing production technologies demand more complex and faster testing to increase product reliability and get products to market sooner. A new C V test system enables tightly integrated C-V/I-V/pulse testing in a compact, benchtop design that lets users of all experience levels make expert measurements. Moreover, its price and capabilities can lower ownership costs for the semiconductor fabs and labs that use it.

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