Automated Test Summit 2008

What is the Automated Test Summit?
The Automated Test Summit is an annual virtual industry event for test and design engineers hosted by National Instruments. It includes a virtual trade show floor with exhibits, interactive Q&A, live keynotes, and several live technical tracks. You can experience all of these events just as you would if you were attending the conference yourself, but from the convenience of your desk (Fig. 1).

How can I see this event?
If you missed the event, which launched on June 5, no problem. You can watch the keynote presentations and technical sessions on demand by registering at www.ni.com/testsummit. Schedule time at your convenience to watch those sessions related to your work (Fig. 2).

How much does this event cost?
The Automated Test Summit is free.

What is the purpose of the Automated Test Summit?
NI’s goal is to show engineers how to reduce software development cost in test systems, the latest trends in hardware design, and how to extend the life of their test systems. It brings together major players in this field to share their tips and best practices in test systems.

Who should visit the Automated Test Summit?
The keynotes and technical sessions target design and test engineers. However, almost any electronic or mechanical engineer can benefit by learning the latest in test practices and proven strategies for designing flexible and efficient test systems.

Which companies support the Automated Test Summit?
The companies and partners for this year’s summit include Averna, Cal- Bay Systems, Cyth Systems, Geensys, Huntron, Intel, Microsoft, National Instruments, Tektronix, VI Technology, VI Engineering, and Wistech. Representatives from most of these companies offered presentations in the conference sessions and keynotes.

All of these companies have booths in the virtual exhibits (Fig. 3). You can click on any booth and get a full tour of the company and its products. You can even download brochures and other info just as you would pick up literature at a physical show.

What are some of the features of the Automated Test Summit this year?
Mike Santori of National Instruments presented the initial keynote, “Five Trends in Automated Test.” Jim St. Leger of Intel and John Pasquarette of National Instruments teamed up for the Americas and Asia regional keynote, “Addressing the Challenge of Multicore Programming.” Furthermore, Matthias Krause of CGS Automotive offered the European regional keynote, “Ideal Test Systems for the Automotive Industry.”

Attendees also can take advantage of four main session tracks, each with its own series of presentations:

• Reducing Software Development Costs

• Implementing Parallel Test Architectures
• The Challenge of Requirements Management
• Fundamentals of a Solid Software Design
• Improving Benchtop Measurement Productivity through Automations

• Optimizing Automated Test Systems

• Why Choose A Modular Test Platform?
• Designing Hybrid Systems with Multiple Instrument Control Buses
• Designing Custom Instrumentation

• Extending the Life of Your Automated Test System

• Building High Availability PXI Systems
• Mitigating Obsolescence with Hardware Abstraction Layers (HAL)
• Guarantee Long-Term Accuracy with Calibration
• Updating Deployed Test Systems

• Test Engineering Panel Discussion

• Inserting Test Engineering in the Design Cycle
• Enhancing Your Test Engineering Team
• Optimizing Test System Management: A Global Approach
• Developing A Test Strategy Based On Product Mix And Volume

For additional details and to download a complete agenda, go to www.ni.com/testsummit.

Product Q&A

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