The UltraPAC80, UltraPin1600, UltraSerial10G, and UltraVI80 options for the UltraFLEX® Test System support testing of SOC and system-in-package technologies. The UltraPin1600 and the UltraSerial10G contain dedicated Protocol Aware hardware allowing the tester to adapt automatically to frequency, timing, and data latency of multiple interfaces on the DUT.
The UltraPAC80 is a wideband AC waveform source and capture option that handles up to eight source and eight capture channels with coverage up to 80 MHz. The UltraPin1600, with 256 pins/slot and a 1.6-Gb/s maximum data rate, offers same-cycle source synchronous capability for DDR test and up to 18 time domains for concurrent testing of complex devices.
The UltraSerial10G provides up to 20 bidirectional ports and a data rate to 10.7 Gb/s. The UltraVI80 is a DUT power and embedded converter option featuring 80 pins/instrument, at up to 1 A/pin; hardware-based spike check; and per-pin converter test capability.
Teradyne
