Semiconductor quantity and functionality in cars continues to grow. As each type of device poses unique test challenges, a one-size-fits-all test approach won’t suffice. A test strategy is needed that integrates solutions optimized for specific chips and functions.
Cutting-edge advances in current-sensing technologies are revolutionizing power management, precision, and efficiency across automotive, industrial, and energy sectors.
Discover the power of advanced embedded debug techniques with jitter and real-time eye analysis. Attendees will learn how Jitter and Eye Diagram analysis can help identify timing issues, improve signal integrity, and optimize serial communications—efficiently and affordably.
IoT device security a feature no more? Recently enacted and upcoming cybersecurity regulations and standards will significantly impact how these devices are designed.
