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January 2008
Jan. 1, 2008
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Solving the contact resistance challenge for 7nm and beyond CMOS
Wearable Skin Patches: The “Hot” Medical Research Field
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Pulsed RF Power for Angstrom-Scale Processes
Adapting to UN Regulation 155: Automotive Cybersecurity Solutions
SMU Tests Nanoscale and 2D Semiconductor Devices
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