Big Data Optimizes Semiconductors and Systems (.PDF Download)

Oct. 16, 2015

With over 200 billion of semiconductor devices expected to ship in 2015, making sure they’re all acceptable for their target market creates an interesting challenge for test and quality-control engineers. Smart design and test teams have employed steadily improving real-time data analysis to help balance quality and quantity. Now, “big-data” analysis is turning its focus to systems by tracking components to ensure optimum performance matching, while also accelerating the system debug process...

Register or Sign in below to download the full article in .PDF format, including high resolution graphics and schematics when applicable.

Sponsored

Embedded Mobile Driven by Human Interface

The monitoring of activity for people as operators in a world of M2M communications is moving from a dream to a practical and ubiquitous reality.

RC191xx PCIe Gen7 1.8V Fanout Buffer Family with LOS

The RC191xx (RC19108, RC19104, and RC19102) ultra-high performance fanout buffers support PCIe Gen1-7. They provide a Loss-Of-Signal (LOS) output for system monitoring and redundancy...

The Basics of Voltage Controlled Oscillators (VCOs)

VCOs fill the need for voltage-based frequency control that is required in a number of applications.

Capacitive Sensor with SLG47011 AnalogPAK™

This application note describes the circuitry using the SLG47011 to create a capacitive sensor. Design files are included in the References section.