Solutions provide total NAND flash memory test

T5773 and HA5100CELL are new solutions that accommodate high-capacity, high-speed, next-generation NAND flash memory devices from wafer test to volume production. The T5773 Test System provides package test for flash memory used in high-speed interfaces for SSDs, handsets, and other applications that need as much as four times the test speed of previous types. The operating frequency range is 200 MHz/400 Mb/s, and typical parallel test capacity is 768 DUTs.

The HA5100CELL, based on the Harmonic architecture, combines a tester and prober in one tool and four test cells into one for wafer test. It features an operating frequency of 100 MHz and a maximum parallel test capacity of 6,144 DUTs.

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