AOI System
The M1m Automated Optical Inspection (AOI) System is designed to accommodate advanced microelectronics and semiconductor packages. It includes specific algorithms for wire/wire-bond presence, quality, and position inspection; high-accuracy die inspection; surface-finish inspection for contamination and scratches; and material dimensional inspection. It also inspects for epoxy underfill and paste/epoxy squeeze-out and bridging.
The system uses the company’s megapixel color technology and fits within a footprint of less than 1 m2. Programming the M1m is fast and intuitive. With CAD data input, a complete recipe can be completed in less than one hour. The offline programming option allows an engineer to create complete recipes at any remote location without affecting production. The M1m also supports SPC data, defect reports, offline defect classification, offline rework capability, and archived images of every device inspected. In addition, free software upgrades are provided for the life of the system.
Network Test Platform
The TestCenter C100 Test Appliance Platform enables carriers, enterprises, and equipment manufacturers to validate that their terabit, application-aware networks deliver the required performance, availability and security at scale.
The C100 offers broad test coverage on a single test platform. It tests app-aware carrier Ethernet devices, next-generation firewalls, mobile and Wi-Fi networks, and video and content delivery networks (CDN) with deep packet inspection (DPI) and app-aware policy controls. When testing application security, the C100 can generate more than 80 Gb/s of real application traffic and 90 million simultaneous TCP connections. For mobility testing, the C100 emulates millions of subscribers with realistic busy-hour call/data models combining application traffic and complex 2G/3G/LTE and Wi-Fi mobility scenarios.
Wireless Communications Test Set
To anticipate future needs in manufacturing test, the EXT can be configured with a variety of X-Series measurement applications for cellular communications, wireless connectivity, and digital audio/video. The new EXT test set includes three additions: LTE TDD, TD-SCDMA, and analog demodulation. Individual X-Series measurement applications can be included with the original instrument purchase or added later. The E6607B is backward-compatible with the previous-generation E6607A EXT. E6607B EXT: from $43,900; E6617A: from $19,500.
State Data Logger
The OM-CP-STATE101A is a low-cost, battery-powered data logger that records input transitions or contact closures from external sources such as transducers or state initiators. This CE-compliant product offers a 10-year battery life, 4-Hz reading rate, a multiple start/stop function, ultra-high-speed download capability, 406,323 reading storage capacity, optional memory wrap, battery-life indicator, and optional protection. It targets HVAC, chemical, and environmental applications. From $99.
6.5-Digit PXI DMM
The GX2065 software package includes a virtual-instrument panel and Windows 32/64-bit driver libraries for ATEasy, NI LabVIEW, NI LabVIEW/Real-Time, C/C++, Microsoft Visual Basic, Linux 32/64, Delphi, and Pascal. Compatible drivers for the Signametrics SMX2040 and SMX2060 DMMs also are supplied, allowing customers to easily upgrade existing applications. $1,895.
Serial Data Analysis Tools
SDAIII-CompleteLinQ addresses the problem of lane-to-lane-comparisons with LaneScape Comparison Mode and the new Reference Lane. Users can store and display the complete analysis of a lane into the Reference Lane and use a LaneScape display mode to compare the analysis of 1, 2, or all lanes simultaneously. The Reference Lane allows engineers to perform multi-scenario testing. One such test is aggressor on/off analysis, which enables users to measure eye and jitter characteristics with a neighboring aggressor lane turned on, store this analysis to the Reference Lane, and then perform the analysis with the aggressor turned off. The Reference Lane then can be compared to other lanes using the LaneScape display mode.