Most Recent

Test & Measurement

Debugging and Optimization of a USB4 Logical Layer Link

May 5, 2021

Test & Measurement

Characterize Jitter Measurements On 10G Signals

Feb. 10, 2010

Jit Lim

Strategic Planner, USB Type-C testing solutions, Keysight Technologies

https://www.keysight.com/us/en/home.html

Jit Lim has been enabling customers for over 34 years in test and measurement since graduating from MIT in 1986. He has published numerous technical papers and helped many worldwide customers characterize and validate their leading-edge designs. Today Jit Lim is the strategic planner for Keysight’s USB Type-C testing solutions.