• Sep 25, 2014

    How to Optimize Your SerDes Design During the Pre-layout Phase

    In the era of receiver equalization, older stackup and controlled impedance line design tools are obsolete because the metrics that output (frequency response) are irrelevant. The metric that matters today is the post-equalization eye opening....More
  • Aug 22, 2014

    One Size Doesn't Fit All: Which connectivity technology is right for your IoT design and how to easily get started

    TI has the broadest portfolio of wireless connectivity solutions in the market including Wi-Fi, Bluetooth, Bluetooth LE, Sub 1GHz, NFC and Zigbee. This webinar will take you through some of those technologies and key reasons why you would select one over the other....More
  • Sep 10, 2014

    Discover Keysight’s New AWG: Highest Speed, Bandwidth & Channel Density

    Need to test modulation formats, pulse shaping and distortions for complex modulated signals or multi-level digital interfaces? Explore the possibilities with Keysight's new arbitrary waveform generator (AWG) that enables leading edge signal generation for 100G, 400G and 1 Terabit research with the highest flexibility in speed, bandwidth and channel count....More
  • May 22, 2014

    Simultaneous Switching Noise Analysis in DDR4 applications using Power-Aware IBIS Models

    Simultaneous Switching Noise (SSN) analysis is very important in designing the next generation of memory (and serial) interconnects. This webcast discusses DDR4 applications and showcases a methodology to do the SSN analysis which can help identify problem areas, debug issues and optimize the design....More
  • Aug 7, 2014

    Create Complex and 2-Channel Signals with Trueform Generators

    Live Webinar: August 7, 2014 at 1 p.m. ET / 10 a.m. PT | Creating two different signals with a function generator has its complications. Coupled signals need precise timing and flexibility for identical tracking, ratios, inverting or even summing....More
  • Jul 29, 2014

    New Calibration Method Simplifies Measurements of Fixtured Devices

    Live Webinar: July 29, 2014 at 1 p.m. ET / 10 a.m. PT | Historically there have been two methods commonly used to remove the effects of the fixture from the Device Under Test (DUT). The first method is to model the fixture using an EM simulator and use the S parameter results of the simulation to de-embed (remove) the effects of the fixture. It can take some time to create an accurate model for the fixture....More
  • Jul 24, 2014

    EMI/EMC Analysis for High-Speed Digital Design

    Live Webinar: July 24, 2014 at 1 p.m. ET / 10 a.m. PT | Increasing data rates for applications such as 28/32Gbit SERDES and 100Gbit Ethernet make high-speed digital designs extremely challenging. Designers are faced with more stringent EMI and EMC specifications, requiring new design techniques to limit emissions and reduce susceptibility to noisy environments....More
  • Jul 16, 2014

    USB Test Challenges: Fast and Accurate Receiver Characterization

    Live Webinar: July 16, 2014 at 1 p.m. ET / 10 a.m. PT | USB 3.0 controllers are now common in PCs and have begun to appear in devices such as tablets and mobile phones. A wide variety of external storage products use this interface today....More
  • Jul 10, 2014

    Test and Validation of PCIe/NVMe Protocol Designs

    Live Webinar: July 10, 2014 at 1 p.m. ET / 10 a.m. PT | PCI express Solid State Drives (PCIe SSDs) provide significant performance benefits in enterprise storage applications compared to traditional hard disc drives (HDDs) and SSDs. The emergence of non-volatile memory express (NVMe), a scalable host controller protocol developed for PCIe SSDs, provides an efficient and streamlined command set, which even further enhances storage throughput....More
  • May 29, 2014

    Connecting with Panasonic Bluetooth® RF Modules

    Live Webinar: May 29, 2014 at 2 p.m. ET / 11 a.m. PT | Panasonic is an industry leader in new technologies and broad line supplier of RF Modules. In this webcast you will learn about Panasonic’s system solutions to wireless application challenges such as harsh RF environments, improving network reliability, reducing power budgets and more....More

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