Webcasts

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  • May 22, 2014
    webinar

    Simultaneous Switching Noise Analysis in DDR4 applications using Power-Aware IBIS Models

    Simultaneous Switching Noise (SSN) analysis is very important in designing the next generation of memory (and serial) interconnects. This webcast discusses DDR4 applications and showcases a methodology to do the SSN analysis which can help identify problem areas, debug issues and optimize the design....More
  • Aug 7, 2014
    webinar

    Create Complex and 2-Channel Signals with Trueform Generators

    Live Webinar: August 7, 2014 at 1 p.m. ET / 10 a.m. PT | Creating two different signals with a function generator has its complications. Coupled signals need precise timing and flexibility for identical tracking, ratios, inverting or even summing....More
  • Jul 29, 2014
    webinar

    New Calibration Method Simplifies Measurements of Fixtured Devices

    Live Webinar: July 29, 2014 at 1 p.m. ET / 10 a.m. PT | Historically there have been two methods commonly used to remove the effects of the fixture from the Device Under Test (DUT). The first method is to model the fixture using an EM simulator and use the S parameter results of the simulation to de-embed (remove) the effects of the fixture. It can take some time to create an accurate model for the fixture....More
  • Jul 24, 2014
    webinar

    EMI/EMC Analysis for High-Speed Digital Design

    Live Webinar: July 24, 2014 at 1 p.m. ET / 10 a.m. PT | Increasing data rates for applications such as 28/32Gbit SERDES and 100Gbit Ethernet make high-speed digital designs extremely challenging. Designers are faced with more stringent EMI and EMC specifications, requiring new design techniques to limit emissions and reduce susceptibility to noisy environments....More
  • Jul 16, 2014
    webinar

    USB Test Challenges: Fast and Accurate Receiver Characterization

    Live Webinar: July 16, 2014 at 1 p.m. ET / 10 a.m. PT | USB 3.0 controllers are now common in PCs and have begun to appear in devices such as tablets and mobile phones. A wide variety of external storage products use this interface today....More
  • Jul 10, 2014
    webinar

    Test and Validation of PCIe/NVMe Protocol Designs

    Live Webinar: July 10, 2014 at 1 p.m. ET / 10 a.m. PT | PCI express Solid State Drives (PCIe SSDs) provide significant performance benefits in enterprise storage applications compared to traditional hard disc drives (HDDs) and SSDs. The emergence of non-volatile memory express (NVMe), a scalable host controller protocol developed for PCIe SSDs, provides an efficient and streamlined command set, which even further enhances storage throughput....More
  • May 29, 2014
    webinar

    Connecting with Panasonic Bluetooth® RF Modules

    Live Webinar: May 29, 2014 at 2 p.m. ET / 11 a.m. PT | Panasonic is an industry leader in new technologies and broad line supplier of RF Modules. In this webcast you will learn about Panasonic’s system solutions to wireless application challenges such as harsh RF environments, improving network reliability, reducing power budgets and more....More
  • Apr 2, 2014
    webinar

    MIPI Physical Layer Transmitter Test Solutions

    Live Webinar: April 2, 2014 at 1 p.m. ET / 10 a.m. PT | New physical standards are being developed by Mobile Industry Processor Interface (MIPI) Alliance standards body, which standardizes interfaces for mobile applications and designs. Additional capabilities and data rate extensions will be added to the existing D-PHY and M-PHY specifications to push the performance envelope. A new C-PHY specification will also be created, which is based on a new 3-wire multi-level signaling scheme to achieve higher performance through higher bits/symbol. If you are developing or validating the transmitters of these new MIPI physical layers, you'll want to attend this webcast to understand the new test challenges as well as the solutions....More
  • Mar 27, 2014
    webinar

    Simulation-Measurement Workflow for DDR Compliance

    Live Webinar: March 27, 2014 at 1 p.m. ET / 10 a.m. PT | This webcast discusses Agilent DDR3 and DDR4 compliance test applications using both pre-silicon simulated waveforms and post-silicon measured waveforms, with emphasis on correlating simulation with measurement. We will describe a methodology for simulating the full path from memory controller to DRAM solder ball. A simulation-measurement correlation methodology called “Waveform Bridge” is discussed where DQ and DQS waveforms in both pre-layout and post-layout simulations are used to feed a DDR compliance test app....More
  • Mar 12, 2014
    webinar

    Do You Have What it Takes to Test HDMI 2.0?

    Live Webinar: March 12, 2014 at 1 p.m. ET/10am PT | In this webcast, we will provide an HDMI 2.0 technical overview as well as cover the latest physical layer testing requirements for HDMI 2.0 as well as the previous specification (HDMI 1.4b). Join us to learn about the new testing requirements and what it takes to stay ahead of HDMI physical layer testing challenges....More

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