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Welcome to Electronic Design's destination for test and measurement technology trends, products, industry news, new applications, articles and commentary from our contributing technical experts and the community.

Find and Fix Power-Supply Noise Issues When Charging Cells

  • May 11, 2016
    Webinar

    Testing Wireless Power Transfer Designs

    Charging battery-operated devices from something as small as a smart watch to as large as an electric-powered bus have traditionally been accomplished with charging cables and AC/DC power adapters of various sizes. However, battery-operated devices are quickly becoming untethered today with the rapid adoption of wireless charging technology. There are two major wireless charging technologies based on either magnetic induction or magnetic resonance. Products based on either or both of these technologies must meet stringent standards....More
  • May 3, 2016
    Webinar

    DisplayPort 1.3 over Type-C: Taming the Gotchas!

    VESA released the first type C connector alternate mode specification shortly after the USB-IF released its power delivery and type C specifications, by tailoring the DP1.3 specification to the new connector. This presentation will provide an overview of how the alternate mode works for DisplayPort and discuss in depth the implications of the type C specification and how it changes the testing approach to DisplayPort....More
  • Apr 14, 2016
    Datasheet

    Engineering Principles Kids Are Exploring at the USA Science Fair (.PDF Download)

    This handout is designed to help students (young and old) see the basic engineering principles of things they use, play with, drive, or enjoy in their daily lives....More
  • Apr 12, 2016
    Commentary

    Low(er)-Cost Test Makes WiGig Even More Attractive 1

    WiGig’s 7-Gb/s throughput in the 60-GHz region has flirted with reality since at least 2007, but the emergence of ICs, modules, full end-equipment designs, and now lower-cost test solutions may make 2016 the year it breaks through....More
Commentaries and Blogs
Guest Blogs
Apr 8, 2016
Commentary

Confabbing on the Fabless Fad 3

High capital and maintenance costs, and EDA advances along with abstractions to deal with chip complexity, have been leading contributors to the fabless migration....More
Mar 2, 2016
Article

Home or Very Small Office Electronic Circuit Prototypes, Part 4 5

Part 4 focuses on testing for a reflow oven and build of a mixed SMT/through-hole board....More
Jan 4, 2016
blog

Building Home or Very Small Office Electronic Circuit Prototypes, Part 3 11

Part 3 delves into critical equipment for testing today's electronics, and provides updates on circuit-board designs from Part 1....More

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