The latest version of the Versatest series of nonvolatile memory (NVM) test systems speeds MP3 players, PDAs, and wireless communications devices to market. Built by Agilent Technologies, the V4400 uses a flexible architecture to ad-dress manufacturers' needs for increased throughput at a re-duced cost.
Agilent sees it as a response to the in-creased demand for Flash memory driven by the rapidly growing popularity of consumer electronics, ranging from wireless communications devices to digital cameras. The V4400 NVM test system uses Agilent's Tester-per-Site architecture for higher throughput and accuracy and increased parallelism, as well as to reduce the test's overall cost.
A general-purpose wafer-soft and final test system, the V4400 targets discrete nonvolatile memory devices, embedded nonvolatile memory cores with logic, and specialty memories. To meet present and future needs, it can test discrete, burst mode, or embedded Flash devices. Also, this system can facilitate testing of complex memories. It's compatible with all of Agilent's memory test systems.
Up to 36 NOR or 144 NAND devices can be tested in parallel. The V4400 is comprised of a single test head with four quadrants, each of which contains nine test sites. It offers 64 pins per site for a total pin count of 2304, which Agilent claims is the highest pin count of any single-head test system on the market. All main electronics for 36 sites are located in a single, compact test head, reducing the amount of test-floor space required.
Operating at 100 MHz, the system can also run at 200 MHz in the "multiplex" mode. Optionally, up to eight sites can be combined to create a single site in the master/slave mode. This lets the system test devices with up to 512 pins.
Available early next year, the V4400 test system starts at $560,000.
Agilent Technologies, Test and Measurement Call Center, P.O. Box 4026, Englewood, CO 80155-4026; (800) 452-4844; www.agilent.com.
