Test at Breakneck Speeds with System Power Supplies

Overview

Title: Test at Breakneck Speeds with System Power Supplies
Date: Thursday, March 30, 2017
Time: 01:00 PM Eastern Daylight Time

Summary

Why This Webcast is Important
Improving test throughput is a challenge most anyone involved with providing electronic products, assemblies, or components is faced with in order to remain competitive. Making even small improvements is deemed very worthwhile as it reduces cost in a number of direct ways, such as operator test time, and indirect ways, such as improved workflow. Learn how the test system DC power supply can have a large impact on test time in a multitude of ways, from fundamental speed performance differences that can take seconds off test time, to advanced capabilities that can squeeze every last millisecond out of that specialized component test need!

Who should attend
Engineers performing tests in development, design validation, and manufacturing where improving test throughput is a critical goal.

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Sponsor

Speaker

Russ Clegg
Application Engineer | Automotive and Energy Solutions
Keysight Technologies

 

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