The TS-900 PXI Semiconductor Test System for component, SOC, and SiP test applications offers up to 512 100-MHz channels with per-pin PMUs and an integrated receiver interface for digital and mixed-signal test applications. The 20-slot 3U chassis, available in a benchtop or cart configuration, supports a range of analog, power supply, and RF resources. A custom-designed test interface accommodates PCB DUT boards, and the receiver interface’s pin blocks are field configurable.
The basic TS-900 includes 64 100-MHz digital I/O channels, 64 static digital I/O channels, a programmable user power supply, a system self-test, and a fixture. It ships with the DIOEasy for digital waveform editing/display and ATEasy, which provides an integrated test executive and test development environment. Software tools are available for converting digital vectors from ASCII, WGL, or STIL formats.
Geotest-Marvin Test Systems
