Deembedding, often a necessary and complex task, is made easier with an integrated hardware and software solution.
Verify the true performance of your design while reducing the impact of the signal path, probe, cables, fixtures and other accessories used to measure the signal.
Whether you are debugging a high-speed interface such as DDR or PCIe, characterizing a fast clock or analyzing a complex RF signal, you want to see the real signal and not artifacts of the test setup such as loading or reflections. The process of removing non-ideal signal path effects (attenuation, skew, loading, etc.) is called deembedding.
Learn how integrated voltage sensing solutions support a more efficient and affordable way of measuring battery life to increase driving range and charge time.
The high-voltage CCE4511 interface IC has overvoltage detection, as well as high temperature and overcurrent protection, based on 0.18m HV-CMOS technology. Typical applications...
