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    Find a Whitepaper

    Search for a whitepaper using keywords.
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    White Paper

    Automotive UWB Device Testing Over the Air

    OTA test solutions covering transmitter, receiver and Time of Flight testing in Wireless Automated Testing is described in this white paper
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    Learning Resources

    Creating Smarter, More Efficient Solutions Through Edge AI

    Sponsored by Texas Instruments: Integrating AI into devices on the edge can be simplified with NPU-enhanced MCUs and having the right tools at your fingertips.
    Texas Instruments
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    Learning Resources

    “Auxless” GaN Flyback Converters Tackle AC-DC Adapter Design Challenges

    Sponsored by Texas Instruments: A flyback with a GaN switch offers higher efficiency across all metrics versus silicon—and it’s simpler to design. Enter the auxless option.
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    Learning Resources

    Improve EV Battery System Performance with Integrated Resistor Dividers

    Sponsored by Texas Instruments: Precision management of battery systems requires solutions such as resistor dividers, which offer remarkable specs to meet design demands.
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    Learning Resources

    Annual Salary Survey

    These articles provide an overview and analysis of our annual reader salary survey.
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    Design FAQs

    FAQ: Bidirectional DC Power Test Systems — What They Are and How They Work

    Does your competition have an advantage in power systems testing?
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    Cybersecurity for wireless electronics
    Learning Resources

    Meet the Latest Cybersecurity Standards with New, Integrated Wireless MCUs

    Sponsored by Texas Instruments: More sophisticated cyberthreats have prioritized security measures in wireless electronics design. Thanks to the latest standards, one of the best...
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    Software-defined vehicles: the cars of the future
    Learning Resources

    Software-Defined Vehicles: The Future of the Automotive Industry

    Sponsored by Texas Instruments: The poster child for new automotive technology is a dynamic, adaptable system that allows for continuous improvements to the driving experience...
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    White Paper

    Kikusui Electronic Loads Enable for DC/DC Transient Testing

    Various test configurations require a DC electronic load with a rapid slew rate to thoroughly evaluate the impedance variations of the device under test (DUT).