Reducing IR and EM issues with automated via insertion
April 14, 2021
This paper introduces an automated via insertion flow that works with all foundries and for all processes.
IR drop and EM issues are significant performance and reliability detractors at advanced nodes. Adding vias is the most effective means of correction, but traditional custom scripts are difficult and time-consuming, and do not guarantee correct-by-construction vias. The Calibe YieldEnhancer PowerVia utility uses manufacturing requirements to perform automated insertion of DRC/LVS-clean vias. Results show significant improvements in EM/IR results, including substantial reductions in current density violations.
Integrating USB Type-C connectors into designs requires developers pay careful attention to proper connector options and recommended layout guidelines.
