Tools for Your Top Millimeter-wave Test Challenges
July 1, 2021
Learn key considerations when tackling the test challenges for today’s and tomorrow’s millimeter-wave applications.
Millimeter-wave technology transforms wireless communications by enabling higher data throughput. It brings a new set of test challenges to the lab including excessive path loss and wideband noise, that degrade measurement accuracy and repeatability.
Download Keysight's white paper, Tackling Millimeter-wave Signal Analysis Challenges, to get the most out of your measurements and see the real performance of your mmWave devices.
Learn how integrated voltage sensing solutions support a more efficient and affordable way of measuring battery life to increase driving range and charge time.
The high-voltage CCE4511 interface IC has overvoltage detection, as well as high temperature and overcurrent protection, based on 0.18m HV-CMOS technology. Typical applications...
