Tools for Your Top Millimeter-wave Test Challenges
July 1, 2021
Learn key considerations when tackling the test challenges for today’s and tomorrow’s millimeter-wave applications.
Millimeter-wave technology transforms wireless communications by enabling higher data throughput. It brings a new set of test challenges to the lab including excessive path loss and wideband noise, that degrade measurement accuracy and repeatability.
Download Keysight's white paper, Tackling Millimeter-wave Signal Analysis Challenges, to get the most out of your measurements and see the real performance of your mmWave devices.
This article describes the advantages of open-loop sensors over closed-loop current sensors. Examples of LEM and Honeywell open-loop sensors are described.
