• Complex Ate Flow F8 D3 Ff51 5cc7617bbc722

    Whitepaper: Accelerating Test Pattern Bring-Up for Rapid First Silicon Debug

    Feb. 18, 2019
    This standard silicon bring-up flow is becoming too slow and expensive, especially for very large designs with complex DFT structures. This whitepaper from Mentor Graphics explains how to speed up the silicon bring-up process.
    Ee 0219 Mentor Wp 200px
    Reducing the time spent on silicon bring-up is critical in getting ICs into the hands of customers and staying competitive. Typically, the silicon bring-up process involves converting the test patterns to a tester-specific format and generating a test program that is executed by Automatic Test Equipment (ATE). This standard silicon bring-up flow is becoming too slow and expensive, especially for very large designs with complex DFT structures.

    Download the whitepaper here

    Continue Reading

    Sponsored

    The high-voltage CCE4511 interface IC has overvoltage detection, as well as high temperature and overcurrent protection, based on 0.18m HV-CMOS technology. Typical applications...
    Transformers are widely used to efficiently transfer both power and data in switching power supplies, MOSFET gate drivers, and isolation circuits.
    Advanced asset tracking applications, such as livestock monitoring, fleet management, and logistics, automatically capture current status information and position coordinates ...
    Learn how integrated voltage sensing solutions support a more efficient and affordable way of measuring battery life to increase driving range and charge time.