IROC Technologies was tasked by the European Space Agency (ESA) to assess the suitability of Ultra Deep Submicron (UDSM) technology nodes below 22 nm for space applications.
IROC set out to build a system-on-chip (SoC) to act as the test vehicle for accurately measuring the effects of single events or soft errors on those devices due to radiation. IROC needed an intuitive and easy-to-use design software to develop the IC test vehicle within a short timeframe.
In this white paper, learn more about how IROC delivered final reliability reports to ESA faster than expected by cutting the expected IC design time.
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