In Brief: Memory, Video, Board, and Communications Test
December 10, 2012. Recent product highlights include a new DDR test capability from Tektronx, board test and programming enhancements from GOEPEL, and video and communications test capabilities from Rohde & Schwarz, Aeroflex, Anritsu, and AWT Global.
Tektronix has announced that it is adding full electrical verification and conformance test support for JEDEC DDR4, DDR3L, and LPDDR3 standards. To support memory interface electrical conformance testing and debug of the new standards, Tektronix now offers integrated support for the next generation memory standards in its popular DDRA analysis software. Available for MSO/DPO/DSA70000, DPO7000, and MSO/DPO5000 Series oscilloscopes, it now supports all generations of DDR standards. By automating test setup and execution, DDRA gives memory designers the confidence that they are in full conformance with memory standards. Should a memory system fail conformance tests, designers can switch to debug mode and use tools like the Visual Trigger capability on Tektronix oscilloscopes to isolate events of interest for deeper root-cause analysis with the DPOJET Jitter and Eye measurement toolkit. www.tektronix.com
GOEPEL electronic has announced the introduction of additional RAPIDO series inline production systems for high-speed programming as well as board test based on the GOEPEL's newest Embedded System Access (ESA) technologies. The new models, named RPS3000-(x), support double-sided probing for up to 3000 nails. Non-volatile flash, microcontrollers (MCU), and programmable logic devices (PLD) can be on-board programmed even faster and more reliably. Based on an enhanced SCANFLEX architecture with short-wire interfacing for up to 32 sites, the systems support combining programming tasks with test strategies such as boundary scan, processor emulation, or functional test. www.goepel.com
Rohde & Schwarz has announced that in late November, the MHL Consortium certified the R&S VTC, R&S VTE, and R&S VTS video testers for acceptance testing on the new MHL 2.0 interface. This interface is used by mobile consumer electronics equipment, for example, to transmit 3-D video data to HDTV devices. The Rohde & Schwarz video tester family now allows manufacturers to perform acceptance testing on sources, loads, and dongles in accordance with the test items detailed in sections 3.2, 4.2, and 5.2 of Compliance Test Specifications (CTS) 2.0. Transmissions in packet-pixel as well as in 24-bit mode are supported. www.rohde-schwarz.com
Aeroflex has announced that the TM500 Test Mobile is the first to market to support full protocol stack UE (user equipment) emulation that enables network testing and measurements for the DC-HSUPA (Dual Cell High-Speed Upload Packet Access) standard specified in 3GPP W-CDMA Release 9. DC-HSUPA allows a UE to simultaneously transmit data over two independent enhanced uplink data channels, boosting both the uplink data rate and the network capacity, enabling maximum per-UE uplink data rates approaching 23 Mbps, thereby effectively doubling the maximum rate. The TM500 DC-HSUPA Test Mobile enables 3G infrastructure equipment manufacturers to perform rigorous performance testing of their DC-HSUPA base station, speeding up the development of infrastructure equipment and its deployment in networks. The TM500 provides the detailed measurement data required by infrastructure engineers for rapid diagnosis of engineering issues, prior to the availability of actual handsets. www.aeroflex.com
Anritsu has introduced the MG3740A analog signal generator, which outputs AM/FM/ΦM test signals for evaluation of narrowband analog radio equipment used in public safety networks and private commercial networks. The instrument's -140 dBc/Hz SSB phase noise optimizes the test signals generated by the MG3740A, allowing engineers to conduct accurate evaluations of narrowband analog radio equipment and components. Featuring level accuracy of ±0.5 dB over a level range of -110 to +17 dBm, the MG3740A allows for accurate tests of radio Rx sensitivity and amplifier distortion characteristics. The MG3740A can be configured with an option that outputs digital modulations. With the option, the MG3740A can be used as a test signal source for dual-mode radio equipment supporting both analog and digital communications. Additionally, the MG3740A can be configured with two sets of test signal output ports, eliminating the need for separate signal generators, reducing costs and saving space. With the option, the MG3740A can support both the wanted and interference waveform tests required by analog radio standards. www.anritsu.com
AWT Global said it has launched a new line of portable passive intermodulation (PIM) testers with an extended carrier power range: the PIM+ series. These systems are equally suited for testing macro cells as well as outdoor and in-building DAS installations. While 2×20-W (2×43-dBm) carrier power is the reference for standard for PIM test systems, the new PIM+ offers an extended adjustable power range of +15 dBm to +44 dBm for each carrier. This low power capability is required for testing components that are designed for use in low power in-building DAS applications. Additionally, the new PIM+ can utilize only a single amplifier as a signal generator for insertion loss testing, when needed. Important measurement options like return loss (VSWR), distance to fault (DTF), and distance to PIM (DTP) are fully integrated into the tester, making it convenient for field work. www.awt-global.com
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