NI Debuts PXI Digitizer and Jitter Analysis Toolkit
January 29, 2013. National Instruments at DesignCon highlighted its new NI PXIe-5162 digitizer and updates to the LabVIEW Jitter Analysis Toolkit. The digitizer, with 10 bits of vertical resolution and a 5-GS/s sample rate, provides high-speed measurements at four times the vertical resolution of a traditional 8-bit oscilloscope. With 1.5 GHz of bandwidth and four channels in a single slot, the NI PXIe-5162 is suited for high-channel-count digitizer systems in manufacturing test, research, and device characterization. Engineers can use the digitizer with LabVIEW and the LabVIEW Jitter Analysis Toolkit, which provides a library of functions optimized for performing the high-throughput jitter, eye-diagram, and phase-noise measurements demanded by automated validation and production test environments.
“The combination of high-speed, high-channel and high-resolution measurements offered by the NI PXIe-5162 digitizer makes it possible for traditional oscilloscope customers to think beyond traditional box instruments for automated test,” said Steve Warntjes, NI director of modular instruments research and development. “Using our high-speed digitizers with the LabVIEW Jitter Analysis Toolkit helps engineers accelerate their measurement systems using the processing power of modern PCs instead of the legacy embedded processors on box oscilloscopes.”
The NI PXIe-5162 features four channels in a single 3U PXI Express slot, expanding to 68 channels in a single PXI chassis, and a 5-GS/s maximum sample rate on one channel or 1.25 GS/s on four channels simultaneously.
The LabVIEW Jitter Analysis Toolkit Features built-in functions for clock recovery, eye diagram, jitter, level, and timing measurements as well as sample programs for eye diagram and mask testing and random and deterministic jitter (RJ/DJ) separation using both dual-Dirac and spectrum-based separation methods.