Keithley Adds High Power Wafer-Level Testing to Characterization Software
March 26, 2013. Keithley Instruments Inc. has announced enhancements to its Automated Characterization Suite (ACS) software that support its expanding family of high-power semiconductor characterization systems. The ACS package is optimized for automated wafer-level parameter test applications, including automated characterization, reliability analysis, and known-good-die testing. The ACS V5.0 update specifically leverages the high-power capabilities of Keithley’s Model 2651A (high current) and Model 2657A (high voltage) System SourceMeter SMU instruments to enable automated wafer-level testing of high power semiconductor devices like power MOSFETs, IGBTs, BJTs, and diodes.
Keithley has incorporated a variety of enhancements into ACS V5.0:
- High-power device libraries designed for use with the Models 2651A (up to 50 A or 100 A when connecting two units) and 2657A (up to 3,000 V) System SourceMeter SMU instruments in conjunction with lower power Series 2600B SourceMeter SMU instruments or the Model 4200-SCS Parameter Analyzer;
- Support for hardware scan, recognition, and configuration management of the high-power Models 2651A and 2657A so users can quickly connect these instruments to a PC, confirm connectivity, and begin testing;
- Support for Series 2600 SMU instruments equipped with the TSP-Link inter-unit communication bus, leveraging the on-board test script processor (TSP) technology for a multiprocessor environment;
- Sample projects for tests such as high-voltage wafer level reliability (WLR) that build on the wide range of low-power reliability test capabilities provided in earlier ACS releases; and
- Support for the ±200V C-V capability of the Model 4200-CVU-PWR C-V Power Package option for the Model 4200-SCS Parameter Analyzer to provide a range of I-V and C-V measurement capability for full characterization of semiconductor power components.
ACS combines multiple instruments into a unified test environment optimized for flexibility, speed, and productivity in testing and analysis. Its intuitive GUI simplifies configuring test instrumentation, setting measurement parameters, making I‑V measurements, and displaying results. Users can go from creating a new test setup to characterizing new devices in a fraction of the time required by older test development approaches. ACS provides all the tools needed to set up tests, analyze data, and export results—without leaving the ACS environment. ACS is designed for testing with semi and fully automatic probers; Keithley also offers ACS Basic Edition software for performing semiconductor device characterization with manual probers or test fixtures.
ACS V5.0 is available with a number of Keithley characterization instrument and system configurations. Users of earlier versions should contact their representative for assistance regarding ACS upgrades.
www.keithley.com/products/semiconductor/characterizationsoftware