DC/DC-converter, LED examples highlight SMU benefits

A source-measure unit (SMU) provides an efficient way to apply precision stimulus to a device under test while simultaneously accurately measuring the DUT response. SMUs are suitable for a variety of applications, including semiconductor device characterization.

In a paper posted on the PXI Systems Alliance website, National Instruments explains how to use its new NI PXIe-4139 SMUs, introduced at DesignCon in January, to measure the power efficiency of a Texas Instruments TPS54360 step-down converter over a wide I/V range.

The paper also describes how to use the instrument's pulse mode to characterize a CREE LED  with a 37-V forward voltage—beyond the 20-VDC range of the instrument. In addition to enabling the measurement, the pulse capability minimizes heat dissipation in the DUT.

View the complete paper here. The white paper is also available on ni.com here.

You can find more information on the NI PXIe-4139 on its model page as well as more information on SMUs at ni.com/smu.