May 6, 2014. The VHX-5000 Digital Microscope from KEYENCE integrates recent advancements in optical and digital technologies to instantly capture any area in complete focus—without the need for the user to adjust focus. The VHX Series was designed to overcome the limitations of traditional optical microscopes by providing high-resolution, large depth-of-field imaging and integrated 2D/3D measurement in a system that anyone can easily pick up and operate without any specialized training.
The VHX-5000 is equipped with a new CMOS camera, capable of imaging at 50 frames per second. Having a high frame rate camera and new graphics engine are essential to the advanced operation of the microscope and give it the unique ability to provide fully focused images in as little as one second. Users simply need to move to the area that they want to view, and the VHX will automatically scan throughout the focal range and generate an image that’s completely in focus. Objects can now be seen in sharp focus in a fraction of the time of any other system on the market.
While conventional microscopes will struggle when imaging low contrast and highly-reflective objects, the VHX-5000 is able to enhance contrast and reduce over/under saturated areas on a target using a High Dynamic Range algorithm. This function can now be combined with a Super High Resolution imaging mode that uses short-wavelength light and pixel shift technology to improve resolution by up to 25%. Now any object can be seen in sharp contrast and detail.
In order to facilitate any user being able to operate the equipment, an Easy Mode has been developed that walks users through the implementation of each function of the VHX and makes them accessible with just a click of the mouse.
With a magnification range from 0.1x to 5,000x, the VHX Series enables a range of microscopic observation from macroscale stereoscopic imaging to the detailed analysis of an SEM. Many lighting techniques are also supported including bright and dark field, transmitted, polarized, and differential interference observation.