Yokogawa Passive Probes

Yokogawa debuts passive oscilloscope probes

Nov. 25, 2014

The models 702902 and 702906 from Yokogawa are 10:1 passive oscilloscope probes that operate from -40̊ C to +85̊ C. As a result, they are suitable for use in accelerated testing and validation applications where temperature cycling is part of the test procedure.

The 702902 is designed for use with the isolated BNC input modules of Yokogawa’s DL850E ScopeCorder family, whereas the 702906 is intended to be used with the non-isolated BNC inputs of the Yokogawa DLM4000 and DLM2000 series of oscilloscopes.

The probes are fitted with long (2.5-m) cables, making it easy to keep the measuring instrument away from the high-temperature measurement point. Longer probes are also required to connect the measuring instrument to a temperature-controlled chamber.

To ensure reliability under severe environmental conditions, these probes have been proven to withstand a cable-mount pulling force of 60 N and have been tested over 500 temperature cycles. In addition to supporting isolated and non-isolated inputs, these probes can also be used with a range of probe-tip conversion adaptors to connect the probe to the application in the most convenient way. The choice of adaptors includes safety mini clips, fork terminal adapters, small or large alligator clips, and 4-mm conversion adaptors with pincher tip or safety banana connectors.

Typical applications include accelerated testing and validation of automotive parts and designs inside a temperature chamber and the environmental testing of power converters designed for outside installations, such as the inverters and transformers used for solar photovoltaic and wind-turbine power generation.

Other uses include the evaluation and environmental testing of sensors and actuators used in automotive, railway, aerospace and marine applications, and the testing of home appliances such as air-conditioners, cookers and refrigerators.

tmi.yokogawa.com.

About the Author

Rick Nelson | Contributing Editor

Rick is currently Contributing Technical Editor. He was Executive Editor for EE in 2011-2018. Previously he served on several publications, including EDN and Vision Systems Design, and has received awards for signed editorials from the American Society of Business Publication Editors. He began as a design engineer at General Electric and Litton Industries and earned a BSEE degree from Penn State.

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