Pasternack introduces 75-Ω test cables up to 3 GHz

March 18, 2015

Pasternack, a manufacturer and supplier of RF, microwave, and millimeter-wave products, announced the release of its newest line of 75-Ω test cables with operation up to 3 GHz. These rugged cable assemblies are designed to withstand the rigors of test lab use and applications in 75-Ω ohm communications systems. Technicians commonly rely on these high-frequency test cables in technologies such as cable TV, MoCA 2.0 and MoCA 1.1 (Media over Coax Alliance), and DOCSIS (Data over Cable Service Interface Specifications).

Pasternack’s new series of high performance 75-Ω test cables are available in two configurations including a type-N male to type-N male or a type-N male to type-F male. Unlike most F connectors readily available on the market, these F connectors are designed to perform up to 3 GHz, which broadens the usability and value of these test cables. Moreover, these connectors are threaded to ensure an accurate and secure connection to both the device under test as well as the analyzer. The test cables are suitable for engineering labs, production environments, and quality testing facilities and are a good choice for use with 75-Ω S-parameter test systems.

The new 75-Ω flexible armored test cables from Pasternack exhibit excellent insertion loss of < 0.5 dB at 3 GHz, and typical return loss is 28 dB. These new RF cable assemblies are designed with an armored jacket that meets ANSI/SCTE 99 2009 pull force and ANSI/SCTE 98 2009 tightening torque standards and are also capable of 100,000 bends minimum.

“Our new 75-Ω test cables provide customers dealing with cable TV media hardware, set-top-box manufacturers, and broadcast engineers a new cost-effective source for high-frequency 75-Ω testing components,” said Steve Ellis, interconnect product manager at Pasternack.

http://www.pasternack.com/pages/RF-Microwave-and-Millimeter-Wave-Products/75-ohm-test-cables-up-to-3-ghz.html

About the Author

Rick Nelson | Contributing Editor

Rick is currently Contributing Technical Editor. He was Executive Editor for EE in 2011-2018. Previously he served on several publications, including EDN and Vision Systems Design, and has received awards for signed editorials from the American Society of Business Publication Editors. He began as a design engineer at General Electric and Litton Industries and earned a BSEE degree from Penn State.

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