Boundary-scan analyzer to support Intel Skylake microarchitecture

April 21, 2015

Keysight Technologies has announced its Keysight x1149 boundary scan analyzer will expand its coverage capabilities to test the upcoming Intel microarchitecture codenamed Skylake.

The Keysight x1149 analyzer is designed to maximize structural test coverage for board designs that incorporate Intel processors. This additional test application for the Intel microarchitecture codenamed Skylake will help electronics designers and manufacturers use the x1149 to test boards with the new microprocessor architecture using boundary scan and Intel Silicon View Technology (Intel SVT).

Test engineers who need a powerful yet easy to use solution for developing their products based on the Intel microarchitecture codenamed Skylake will find the x1149 boundary scan analyzer a viable option to solve the test challenges of extremely limited test access of complex PCBAs with high-speed devices.

www.keysight.com/find/x1149

See related article:

Shrinking geometries pose test and inspection challenges

About the Author

Rick Nelson | Contributing Editor

Rick is currently Contributing Technical Editor. He was Executive Editor for EE in 2011-2018. Previously he served on several publications, including EDN and Vision Systems Design, and has received awards for signed editorials from the American Society of Business Publication Editors. He began as a design engineer at General Electric and Litton Industries and earned a BSEE degree from Penn State.