VNA test cables mitigate phase change

Oct. 29, 2015

Irvine, CA. Pasternack, a provider of RF, microwave, and millimeter-wave products, has released a new line of ruggedized phase-stable VNA test cables operating up to 40 GHz. These VNA test cables are designed to withstand the rigors of test lab use and production testing for 50-Ω communications systems.

The new phase stable cables can be ordered with male or female versions of SMA or type-N connectors for cables operating to 18 GHz. Also available are 2.92-mm connectors for cables operating to 26.5 GHz or 2.4-mm connectors for test cables performing up to 40 GHz. Torsion-resistant connector heads are directly attached to stainless-steel conduit-style armoring providing a rugged design for up to 5,000 mating cycles with proper care. The cable’s armoring enhances amplitude and phase stability by preventing stress due to over-bending while maintaining the flexibility required for testing in a lab environment.

Pasternack’s new ruggedized VNA test cables have a maximum phase change of ±2° at 18 GHz, ±3° at 26.5 GHz, and ±5° at 40 GHz with typical calibration procedures. Minimal phase change is essential because amplitude and phase variation following VNA calibration can cause inaccurate S-parameter measurements. As a result, amplitude- and phase-stable cables are needed to make accurate vector network analyzer measurements. Pasternack’s new amplitude and phase stable ruggedized VNA test cables provide the reliable and repeatable, accurate test results users require.

“Our new VNA test cables provide industry-leading performance up to 40 GHz,” explained Steve Ellis, interconnect product manager at Pasternack. “These test cables are rated to 5,000 mating cycles and 75,000 flexure cycles while still exhibiting excellent amplitude and phase stability to the given frequency.”

www.pasternack.com/pages/RF-Microwave-and-Millimeter-Wave-Products/ruggedized-vna-test-cables.html

About the Author

Rick Nelson | Contributing Editor

Rick is currently Contributing Technical Editor. He was Executive Editor for EE in 2011-2018. Previously he served on several publications, including EDN and Vision Systems Design, and has received awards for signed editorials from the American Society of Business Publication Editors. He began as a design engineer at General Electric and Litton Industries and earned a BSEE degree from Penn State.

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