Richardson, TX. Emerging test technologies, processes, and solutions that address the growing applications in the microwave and millimeter wave (mmWave) bands will be showcased by Anritsu throughout the IEEE MTT-S International Microwave Symposium (IMS) June 4-9 in Honolulu. The company will demonstrate its patented Nonlinear Transmission Line (NLTL) technology, as well as its signal-analyzer and vector-network-analyzer (VNA) test solutions, while company experts will present new techniques and offer insight on test challenges throughout IMS.
“Today’s military/aerospace and commercial communications systems are becoming increasingly complex and operate at higher frequencies. At IMS 2017, Anritsu will showcase technologies and test solutions to help engineers meet the demands associated with these challenging designs. Through our tutorials, speaking engagements, and exhibits, we will offer novel testing approaches that will help successfully and efficiently move technology forward into higher frequencies,” said Paul Innis, vice president and general manager of Anritsu.
At the forefront will be Anritsu’s VectorStar and ShockLine VNA families that feature NLTL technology. The technology offers dynamic range of >100 dB spanning microwave and mmWave frequency ranges. Additionally, it enables a smaller form factor, as well as improved capability-to-cost ratio for more economical testing.
NLTL benefits will be on display in the Anritsu IMS booth. One station will feature simultaneous VNA and spectrum analysis. The demonstration will consist of fully corrected on-wafer VNA measurements from 70 kHz to 110 GHz and spectrum analysis from 10 GHz to 110 GHz using 1-mm modules and couplers with on-wafer probes.
Stability advantages of NLTL-based VNAs will be displayed in a mmWave active-device measurement demonstration. S-parameter, noise figure, and intermodulation distortion measurements will be made in a simple and economical configuration. Also on display will be the 60- to 90-GHz E-band ShockLine VNA, and the ultraportable Spectrum Master VNA MS2760A.
Anritsu will also highlight its MS2830A Spectrum Analyzer/Signal Analyzer, an economical solution that features high performance, including ±0.3 dB (typical) absolute level accuracy and 168-dB dynamic range. A built-in vector signal generator (VSG) outputs continuous wave (CW) and modulated signals that can be used as reference signal sources when testing Tx characteristics as well as signal sources for evaluating Rx characteristics. At IMS, the MS2830A will transmit a modulated signal from the VSG that will be received on the analyzer’s input port and demodulated to display constellation diagram, power level, and EVM.
Speaking sessions and tutorials
Anritsu will participate in technical paper presentations, workshops, and tutorials throughout IMS:
Monday, June 5. Anritsu will participate in two workshops, both of which begin at 8:00 a.m. RF to/from Bits: Challenges in High Frequency Mixed Signal Measurements and Design will include a 10-minute session on “Challenges in Characterization of Mixed Signal Systems” by Dr. Jon Martens of Anritsu. Dr. Martens will also give a 10-minute session entitled “Millimeter-Wave Multi-GHz-IF Receivers: Linearity and Correction Considerations,” as part of Novel 5G Applications of Nonlinear Vector Network Analyzer for Broadband Modulation and Millimeter Wave Characterization.
Wednesday, June 7. Anritsu VNA product manager Steve Reyes will speak on The Future of RF Semiconductor Test, which is part of the MicroApp (Microwave Applications Seminars). The panel will be held from noon to 1:00 p.m.
Friday, June 9. Anritsu will take part in the 89th ARFTG Microwave Measurement Symposium on Advanced Technologies for Communications. The all-day event incorporates oral sessions, exhibits, and interactive forums.
